Characterization of Si/Si1-xGex/Si quantum wells by space-charge spectroscopy

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Bibliographic Details
Published in:Physical review. B, Condensed matter Condensed matter, 1994-11, Vol.50 (19), p.14287-14301
Main Authors: Schmalz, K, Yassievich, IN, Rücker, H, Grimmeiss, HG, Frankenfeld, H, Mehr, W, Osten, HJ, Schley, P, Zeindl, HP
Format: Article
Language:English
Online Access:Get full text
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ISSN:0163-1829
DOI:10.1103/PhysRevB.50.14287