X-ray fluorescence of layered synthetic materials with interfacial roughness

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Bibliographic Details
Published in:Physical review. B, Condensed matter Condensed matter, 1988-11, Vol.38 (13), p.8579-8592
Main Authors: KROL, A, SHER, C. J, KAO, Y. H
Format: Article
Language:English
Subjects:
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties
Physics
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
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ISSN:0163-1829
1095-3795
DOI:10.1103/PhysRevB.38.8579