X-Ray Based Subpicosecond Electron Bunch Characterization Using 90 degrees Thomson Scattering

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Bibliographic Details
Published in:Physical review letters 1996-11, Vol.77 (20), p.4182-4185
Main Authors: Leemans, WP, Schoenlein, RW, Volfbeyn, P, Chin, AH, Glover, TE, Balling, P, Zolotorev, M, Kim, KJ, Chattopadhyay, S, Shank, CV
Format: Article
Language:English
Online Access:Get full text
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ISSN:1079-7114
DOI:10.1103/PhysRevLett.77.4182