Quantitative lattice measurement of thin Langmuir-Blodgett films by atomic-force microscopy

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Bibliographic Details
Published in:Physical review. E, Statistical physics, plasmas, fluids, and related interdisciplinary topics Statistical physics, plasmas, fluids, and related interdisciplinary topics, 1993-01, Vol.47 (1), p.452-460
Main Authors: Schwartz, DK, Garnaes, J, Viswanathan, R, Chiruvolu, S, Zasadzinski, JA
Format: Article
Language:English
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ISSN:1063-651X
1095-3787
DOI:10.1103/physreve.47.452