Vibrationally resolved core-level photoelectron spectroscopy : Si 2p levels of SiH4 and SiF4 molecules

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Published in:Physical review letters 1990-11, Vol.65 (22), p.2757-2760
Main Authors: BOZEK, J. D, BANCROFT, G. M, CUTLER, J. N, TAN, K. H
Format: Article
Language:English
Subjects:
Atomic and molecular physics
Exact sciences and technology
Molecular properties and interactions with photons
Photoelectron spectra
Physics
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container_end_page 2760
container_issue 22
container_start_page 2757
container_title Physical review letters
container_volume 65
creator BOZEK, J. D
BANCROFT, G. M
CUTLER, J. N
TAN, K. H
description
doi_str_mv 10.1103/PhysRevLett.65.2757
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ispartof Physical review letters, 1990-11, Vol.65 (22), p.2757-2760
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1079-7114
language eng
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source American Physical Society:Jisc Collections:APS Read and Publish 2023-2025 (reading list)
subjects Atomic and molecular physics
Exact sciences and technology
Molecular properties and interactions with photons
Photoelectron spectra
Physics
title Vibrationally resolved core-level photoelectron spectroscopy : Si 2p levels of SiH4 and SiF4 molecules
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