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Passivation of shallow acceptors by H in Si: a microscopic study by perturbed angular correlations

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Bibliographic Details
Published in:	Physical review letters 1987-11, Vol.59 (18), p.2087-2090
Main Authors:	WICHERT, T, SKUDLIK, H, DEICHER, M, GRÜBEL, G, KELLER, R, RECKNAGEL, E, SONG, L
Format:	Article
Language:	English
Subjects:	Condensed matter: structure, mechanical and thermal properties Defects and impurities in crystals microstructure Exact sciences and technology Impurities: concentration, distribution, and gradients Physics Structure of solids and liquids crystallography
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