Electrochemical Applications of in Situ Scanning Probe Microscopy

Gewirth and Niece describe recent advances in "in situ" electrochemical scanning tunneling microscopy and atomic force microscopy imaging directed toward understanding processes at the solid/liquid interface.

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Bibliographic Details
Published in:Chemical reviews 1997-06, Vol.97 (4), p.1129-1162
Main Authors: Gewirth, Andrew A, Niece, Brian K
Format: Article
Language:English
Subjects:
Atoms & subatomic particles
Chemical elements
Metals
Microscopes
Scientific imaging
Semiconductors
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Description
Summary:Gewirth and Niece describe recent advances in "in situ" electrochemical scanning tunneling microscopy and atomic force microscopy imaging directed toward understanding processes at the solid/liquid interface.
ISSN:0009-2665
1520-6890
DOI:10.1021/cr960067y