Electrochemical Applications of in Situ Scanning Probe Microscopy

Gewirth and Niece describe recent advances in "in situ" electrochemical scanning tunneling microscopy and atomic force microscopy imaging directed toward understanding processes at the solid/liquid interface.

Saved in:
Bibliographic Details
Published in:Chemical reviews 1997-06, Vol.97 (4), p.1129-1162
Main Authors: Gewirth, Andrew A, Niece, Brian K
Format: Article
Language:English
Subjects:
Atoms & subatomic particles
Chemical elements
Metals
Microscopes
Scientific imaging
Semiconductors
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-a378t-813082104922da1ce8dcd47424e3bb63c0451162197fa66444e53e5574142b833
cites cdi_FETCH-LOGICAL-a378t-813082104922da1ce8dcd47424e3bb63c0451162197fa66444e53e5574142b833
container_end_page 1162
container_issue 4
container_start_page 1129
container_title Chemical reviews
container_volume 97
creator Gewirth, Andrew A
Niece, Brian K
description Gewirth and Niece describe recent advances in "in situ" electrochemical scanning tunneling microscopy and atomic force microscopy imaging directed toward understanding processes at the solid/liquid interface.
doi_str_mv 10.1021/cr960067y
format article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_1859366208</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1859366208</sourcerecordid><originalsourceid>FETCH-LOGICAL-a378t-813082104922da1ce8dcd47424e3bb63c0451162197fa66444e53e5574142b833</originalsourceid><addsrcrecordid>eNpl0E1LwzAYB_AgipvTg19AiiDooZr3tscxNhUVC5vgLaRZppldU5MW3Lc3o2MDPSUhP56XPwDnCN4iiNGdchmHkCfrA9BHDMOYpxk8BH0IYRZjzlkPnHi_DE_GcHIMegilDFHK-mA4LrVqnFWfemWULKNhXZfh0hhb-cguIlNFU9O00VTJqjLVR5Q7W-joxShnvbL1-hQcLWTp9dn2HIC3yXg2eoifX-8fR8PnWJIkbeIUEZhiBGmG8VwipdO5mtOEYqpJUXCiIGUIcYyyZCE5p5RqRjRjCUUUFykhA3Dd1a2d_W61b8TKeKXLUlbatl6ElTLCOYZpoJd_6NK2rgrTCYwpD03xBt10aLOId3ohamdW0q0FgmITq9jFGuzFtmBbrPR8L7c5BhB3wPhG_-z-pfsSPCEJE7N8Kt5nZEJZ_iTy4K86L5XfD_e_8S-Y4Yqn</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>224674228</pqid></control><display><type>article</type><title>Electrochemical Applications of in Situ Scanning Probe Microscopy</title><source>American Chemical Society:Jisc Collections:American Chemical Society Read &amp; Publish Agreement 2022-2024 (Reading list)</source><creator>Gewirth, Andrew A ; Niece, Brian K</creator><creatorcontrib>Gewirth, Andrew A ; Niece, Brian K</creatorcontrib><description>Gewirth and Niece describe recent advances in "in situ" electrochemical scanning tunneling microscopy and atomic force microscopy imaging directed toward understanding processes at the solid/liquid interface.</description><identifier>ISSN: 0009-2665</identifier><identifier>EISSN: 1520-6890</identifier><identifier>DOI: 10.1021/cr960067y</identifier><identifier>PMID: 11851445</identifier><identifier>CODEN: CHREAY</identifier><language>eng</language><publisher>United States: American Chemical Society</publisher><subject>Atoms &amp; subatomic particles ; Chemical elements ; Metals ; Microscopes ; Scientific imaging ; Semiconductors</subject><ispartof>Chemical reviews, 1997-06, Vol.97 (4), p.1129-1162</ispartof><rights>Copyright © 1997 American Chemical Society</rights><rights>Copyright American Chemical Society Jun 1997</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-a378t-813082104922da1ce8dcd47424e3bb63c0451162197fa66444e53e5574142b833</citedby><cites>FETCH-LOGICAL-a378t-813082104922da1ce8dcd47424e3bb63c0451162197fa66444e53e5574142b833</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/11851445$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Gewirth, Andrew A</creatorcontrib><creatorcontrib>Niece, Brian K</creatorcontrib><title>Electrochemical Applications of in Situ Scanning Probe Microscopy</title><title>Chemical reviews</title><addtitle>Chem. Rev</addtitle><description>Gewirth and Niece describe recent advances in "in situ" electrochemical scanning tunneling microscopy and atomic force microscopy imaging directed toward understanding processes at the solid/liquid interface.</description><subject>Atoms &amp; subatomic particles</subject><subject>Chemical elements</subject><subject>Metals</subject><subject>Microscopes</subject><subject>Scientific imaging</subject><subject>Semiconductors</subject><issn>0009-2665</issn><issn>1520-6890</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1997</creationdate><recordtype>article</recordtype><recordid>eNpl0E1LwzAYB_AgipvTg19AiiDooZr3tscxNhUVC5vgLaRZppldU5MW3Lc3o2MDPSUhP56XPwDnCN4iiNGdchmHkCfrA9BHDMOYpxk8BH0IYRZjzlkPnHi_DE_GcHIMegilDFHK-mA4LrVqnFWfemWULKNhXZfh0hhb-cguIlNFU9O00VTJqjLVR5Q7W-joxShnvbL1-hQcLWTp9dn2HIC3yXg2eoifX-8fR8PnWJIkbeIUEZhiBGmG8VwipdO5mtOEYqpJUXCiIGUIcYyyZCE5p5RqRjRjCUUUFykhA3Dd1a2d_W61b8TKeKXLUlbatl6ElTLCOYZpoJd_6NK2rgrTCYwpD03xBt10aLOId3ohamdW0q0FgmITq9jFGuzFtmBbrPR8L7c5BhB3wPhG_-z-pfsSPCEJE7N8Kt5nZEJZ_iTy4K86L5XfD_e_8S-Y4Yqn</recordid><startdate>19970620</startdate><enddate>19970620</enddate><creator>Gewirth, Andrew A</creator><creator>Niece, Brian K</creator><general>American Chemical Society</general><scope>BSCLL</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>7X8</scope></search><sort><creationdate>19970620</creationdate><title>Electrochemical Applications of in Situ Scanning Probe Microscopy</title><author>Gewirth, Andrew A ; Niece, Brian K</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-a378t-813082104922da1ce8dcd47424e3bb63c0451162197fa66444e53e5574142b833</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1997</creationdate><topic>Atoms &amp; subatomic particles</topic><topic>Chemical elements</topic><topic>Metals</topic><topic>Microscopes</topic><topic>Scientific imaging</topic><topic>Semiconductors</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Gewirth, Andrew A</creatorcontrib><creatorcontrib>Niece, Brian K</creatorcontrib><collection>Istex</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>MEDLINE - Academic</collection><jtitle>Chemical reviews</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Gewirth, Andrew A</au><au>Niece, Brian K</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Electrochemical Applications of in Situ Scanning Probe Microscopy</atitle><jtitle>Chemical reviews</jtitle><addtitle>Chem. Rev</addtitle><date>1997-06-20</date><risdate>1997</risdate><volume>97</volume><issue>4</issue><spage>1129</spage><epage>1162</epage><pages>1129-1162</pages><issn>0009-2665</issn><eissn>1520-6890</eissn><coden>CHREAY</coden><abstract>Gewirth and Niece describe recent advances in "in situ" electrochemical scanning tunneling microscopy and atomic force microscopy imaging directed toward understanding processes at the solid/liquid interface.</abstract><cop>United States</cop><pub>American Chemical Society</pub><pmid>11851445</pmid><doi>10.1021/cr960067y</doi><tpages>34</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0009-2665
ispartof Chemical reviews, 1997-06, Vol.97 (4), p.1129-1162
issn 0009-2665
1520-6890
language eng
recordid cdi_proquest_miscellaneous_1859366208
source American Chemical Society:Jisc Collections:American Chemical Society Read & Publish Agreement 2022-2024 (Reading list)
subjects Atoms & subatomic particles
Chemical elements
Metals
Microscopes
Scientific imaging
Semiconductors
title Electrochemical Applications of in Situ Scanning Probe Microscopy
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-07T10%3A13%3A04IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Electrochemical%20Applications%20of%20in%20Situ%20Scanning%20Probe%20Microscopy&rft.jtitle=Chemical%20reviews&rft.au=Gewirth,%20Andrew%20A&rft.date=1997-06-20&rft.volume=97&rft.issue=4&rft.spage=1129&rft.epage=1162&rft.pages=1129-1162&rft.issn=0009-2665&rft.eissn=1520-6890&rft.coden=CHREAY&rft_id=info:doi/10.1021/cr960067y&rft_dat=%3Cproquest_cross%3E1859366208%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-a378t-813082104922da1ce8dcd47424e3bb63c0451162197fa66444e53e5574142b833%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=224674228&rft_id=info:pmid/11851445&rfr_iscdi=true