Rad-hard vertical JFET switch for the HV-MUX system of the ATLAS upgrade Inner Tracker

This work presents a new silicon vertical JFET (V-JFET) device, based on the trenched 3D-detector technology developed at IMB-CNM, to be used as a switch for the High-Voltage powering scheme of the ATLAS upgrade Inner Tracker. The optimization of the device characteristics is performed by 2D and 3D...

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Bibliographic Details
Published in:Journal of instrumentation 2016-01, Vol.11 (1), p.C01043-C01043
Main Authors: Fernández-Martínez, P., Ullán, M., Flores, D., Hidalgo, S., Quirion, D., Lynn, D.
Format: Article
Language:English
Subjects:
Computer simulation
Degradation
Devices
Electric potential
Instrumentation
JFET
Radiation damage
Switches
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Summary:This work presents a new silicon vertical JFET (V-JFET) device, based on the trenched 3D-detector technology developed at IMB-CNM, to be used as a switch for the High-Voltage powering scheme of the ATLAS upgrade Inner Tracker. The optimization of the device characteristics is performed by 2D and 3D TCAD simulations. Special attention has been paid to the on-resistance and the switch-off and breakdown voltages to meet the specific requirements of the system. In addition, a set of parameter values has been extracted from the simulated curves to implement a SPICE model of the proposed V-JFET transistor. As these devices are expected to operate under very high radiation conditions during the whole experiment life-time, a study of the radiation damage effects and the expected degradation of the device performance is also presented at the end of the paper.
ISSN:1748-0221
1748-0221
DOI:10.1088/1748-0221/11/01/C01043