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Microscopy Techniques for Topography Image Acquisition of Marks on Cartridge Cases

Despite very high importance of tool mark analysis in criminalistics domain, the image acquisition and comparison of tool marks remains a difficult and time-consuming effort. This work deals with description of selected microscopy techniques applied to examination of marks on the surface of fired ca...

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Bibliographic Details
Published in:Sensors & transducers 2016-11, Vol.206 (11), p.43-43
Main Authors: Navratil, Milan, Kresalek, Vojtech, Koutecky, Adam, Malanik, Zdenek
Format: Article
Language:English
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Summary:Despite very high importance of tool mark analysis in criminalistics domain, the image acquisition and comparison of tool marks remains a difficult and time-consuming effort. This work deals with description of selected microscopy techniques applied to examination of marks on the surface of fired cartridge cases, specifically on marks after firing pin. They are represented by 3-D topography images (scanning probe microscopy and laser scanning confocal microscopy) and 2-D images (scanning electron microscopy and light microscopy in bright field).
ISSN:2306-8515
1726-5479