Fractal features of carbon-nickel composite thin films

This work analyses the three‐dimensional (3‐D) surface texture of carbon–nickel (C–Ni) films grown by radio frequency (RF) magnetron co‐sputtering on glass substrates. The C–Ni thin films were deposited under different deposition times, from 50 to 600 s, at room temperature. Atomic force microscopy...

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Bibliographic Details
Published in:Microscopy research and technique 2016-12, Vol.79 (12), p.1208-1213
Main Authors: Ţălu, Ştefan, Bramowicz, Miroslaw, Kulesza, Slawomir, Dalouji, Vali, Solaymani, Shahram, Valedbagi, Shahoo
Format: Article
Language:English
Subjects:
carbon-nickel composite thin films
Fractal analysis
Glass
Radio frequencies
RF magnetron co-sputtering
Samples
Statistical methods
Surface layer
Texture
Thin films
three-dimensional surface micromorphology
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Summary:This work analyses the three‐dimensional (3‐D) surface texture of carbon–nickel (C–Ni) films grown by radio frequency (RF) magnetron co‐sputtering on glass substrates. The C–Ni thin films were deposited under different deposition times, from 50 to 600 s, at room temperature. Atomic force microscopy was employed to characterize the 3‐D surface texture data in connection with the statistical, and fractal analyses. It has been found that up to 180 s the sputtering occurs in more metal content mode and in greater than 180 s it occurs in more non‐metal content mode. This behavior demonstrated a strong link between the structural and morphological properties of C–Ni composite films and facilitates a deeper understanding of structure/property relationships and surface defects in prepared samples. Furthermore, these findings can be applied to research on the mechanisms to prepare and control high‐quality C–Ni films.
ISSN:1059-910X
1097-0029
DOI:10.1002/jemt.22779