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Fractal features of carbon-nickel composite thin films
This work analyses the three‐dimensional (3‐D) surface texture of carbon–nickel (C–Ni) films grown by radio frequency (RF) magnetron co‐sputtering on glass substrates. The C–Ni thin films were deposited under different deposition times, from 50 to 600 s, at room temperature. Atomic force microscopy...
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| Published in: | Microscopy research and technique 2016-12, Vol.79 (12), p.1208-1213 |
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| Main Authors: | , , , , , |
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| Language: | English |
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| cited_by | cdi_FETCH-LOGICAL-c4289-4d9352031c411b42ace4a53acb5f972a432e10b9d5112f3622e4af35d0ef3cfd3 |
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| cites | cdi_FETCH-LOGICAL-c4289-4d9352031c411b42ace4a53acb5f972a432e10b9d5112f3622e4af35d0ef3cfd3 |
| container_end_page | 1213 |
| container_issue | 12 |
| container_start_page | 1208 |
| container_title | Microscopy research and technique |
| container_volume | 79 |
| creator | Ţălu, Ştefan Bramowicz, Miroslaw Kulesza, Slawomir Dalouji, Vali Solaymani, Shahram Valedbagi, Shahoo |
| description | This work analyses the three‐dimensional (3‐D) surface texture of carbon–nickel (C–Ni) films grown by radio frequency (RF) magnetron co‐sputtering on glass substrates. The C–Ni thin films were deposited under different deposition times, from 50 to 600 s, at room temperature. Atomic force microscopy was employed to characterize the 3‐D surface texture data in connection with the statistical, and fractal analyses. It has been found that up to 180 s the sputtering occurs in more metal content mode and in greater than 180 s it occurs in more non‐metal content mode. This behavior demonstrated a strong link between the structural and morphological properties of C–Ni composite films and facilitates a deeper understanding of structure/property relationships and surface defects in prepared samples. Furthermore, these findings can be applied to research on the mechanisms to prepare and control high‐quality C–Ni films. |
| doi_str_mv | 10.1002/jemt.22779 |
| format | article |
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The C–Ni thin films were deposited under different deposition times, from 50 to 600 s, at room temperature. Atomic force microscopy was employed to characterize the 3‐D surface texture data in connection with the statistical, and fractal analyses. It has been found that up to 180 s the sputtering occurs in more metal content mode and in greater than 180 s it occurs in more non‐metal content mode. This behavior demonstrated a strong link between the structural and morphological properties of C–Ni composite films and facilitates a deeper understanding of structure/property relationships and surface defects in prepared samples. Furthermore, these findings can be applied to research on the mechanisms to prepare and control high‐quality C–Ni films.</description><identifier>ISSN: 1059-910X</identifier><identifier>EISSN: 1097-0029</identifier><identifier>DOI: 10.1002/jemt.22779</identifier><identifier>PMID: 27639345</identifier><identifier>CODEN: MRTEEO</identifier><language>eng</language><publisher>United States: Blackwell Publishing Ltd</publisher><subject>carbon-nickel composite thin films ; Fractal analysis ; Glass ; Radio frequencies ; RF magnetron co-sputtering ; Samples ; Statistical methods ; Surface layer ; Texture ; Thin films ; three-dimensional surface micromorphology</subject><ispartof>Microscopy research and technique, 2016-12, Vol.79 (12), p.1208-1213</ispartof><rights>2016 Wiley Periodicals, Inc.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c4289-4d9352031c411b42ace4a53acb5f972a432e10b9d5112f3622e4af35d0ef3cfd3</citedby><cites>FETCH-LOGICAL-c4289-4d9352031c411b42ace4a53acb5f972a432e10b9d5112f3622e4af35d0ef3cfd3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/27639345$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Ţălu, Ştefan</creatorcontrib><creatorcontrib>Bramowicz, Miroslaw</creatorcontrib><creatorcontrib>Kulesza, Slawomir</creatorcontrib><creatorcontrib>Dalouji, Vali</creatorcontrib><creatorcontrib>Solaymani, Shahram</creatorcontrib><creatorcontrib>Valedbagi, Shahoo</creatorcontrib><title>Fractal features of carbon-nickel composite thin films</title><title>Microscopy research and technique</title><addtitle>Microsc. Res. Tech</addtitle><description>This work analyses the three‐dimensional (3‐D) surface texture of carbon–nickel (C–Ni) films grown by radio frequency (RF) magnetron co‐sputtering on glass substrates. The C–Ni thin films were deposited under different deposition times, from 50 to 600 s, at room temperature. Atomic force microscopy was employed to characterize the 3‐D surface texture data in connection with the statistical, and fractal analyses. It has been found that up to 180 s the sputtering occurs in more metal content mode and in greater than 180 s it occurs in more non‐metal content mode. This behavior demonstrated a strong link between the structural and morphological properties of C–Ni composite films and facilitates a deeper understanding of structure/property relationships and surface defects in prepared samples. Furthermore, these findings can be applied to research on the mechanisms to prepare and control high‐quality C–Ni films.</description><subject>carbon-nickel composite thin films</subject><subject>Fractal analysis</subject><subject>Glass</subject><subject>Radio frequencies</subject><subject>RF magnetron co-sputtering</subject><subject>Samples</subject><subject>Statistical methods</subject><subject>Surface layer</subject><subject>Texture</subject><subject>Thin films</subject><subject>three-dimensional surface micromorphology</subject><issn>1059-910X</issn><issn>1097-0029</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><recordid>eNqN0E1LwzAYB_Agis7pxQ8gBS8idObJS7scdbipTL0oegtpmmC3vsykRf32pk49eBBPT0h-zx_yR-gA8AgwJqcLU7UjQtJUbKABYJHG4VZs9mcuYgH4aQfter_AGIAD20Y7JE2ooIwPUDJ1SreqjKxRbeeMjxobaeWypo7rQi9NGemmWjW-aE3UPhd1ZIuy8ntoy6rSm_2vOUQP04v7yWU8v5tdTc7msWZkLGKWC8oJpqAZQMaI0oYpTpXOuBUpUYwSAzgTOQcgliaEhHdLeY6NpdrmdIiO17kr17x0xreyKrw2Zalq03RewjhhPAEhyD8oI5wmYQR69Isums7V4SO94qEmint1slbaNd47Y-XKFZVy7xKw7IuXffHys_iAD78iu6wy-Q_9bjoAWIPXojTvf0TJ64ub--_QeL1T-Na8_ewot5RJSlMuH29ncprM-K2AR3lOPwCyTZp6</recordid><startdate>201612</startdate><enddate>201612</enddate><creator>Ţălu, Ştefan</creator><creator>Bramowicz, Miroslaw</creator><creator>Kulesza, Slawomir</creator><creator>Dalouji, Vali</creator><creator>Solaymani, Shahram</creator><creator>Valedbagi, Shahoo</creator><general>Blackwell Publishing Ltd</general><general>Wiley Subscription Services, Inc</general><scope>BSCLL</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7QF</scope><scope>7QO</scope><scope>7QP</scope><scope>7QQ</scope><scope>7SC</scope><scope>7SE</scope><scope>7SP</scope><scope>7SR</scope><scope>7SS</scope><scope>7TA</scope><scope>7TB</scope><scope>7U5</scope><scope>7U7</scope><scope>8BQ</scope><scope>8FD</scope><scope>C1K</scope><scope>F28</scope><scope>FR3</scope><scope>H8D</scope><scope>H8G</scope><scope>JG9</scope><scope>JQ2</scope><scope>K9.</scope><scope>KR7</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><scope>P64</scope><scope>RC3</scope><scope>7X8</scope></search><sort><creationdate>201612</creationdate><title>Fractal features of carbon-nickel composite thin films</title><author>Ţălu, Ştefan ; 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Res. Tech</addtitle><date>2016-12</date><risdate>2016</risdate><volume>79</volume><issue>12</issue><spage>1208</spage><epage>1213</epage><pages>1208-1213</pages><issn>1059-910X</issn><eissn>1097-0029</eissn><coden>MRTEEO</coden><abstract>This work analyses the three‐dimensional (3‐D) surface texture of carbon–nickel (C–Ni) films grown by radio frequency (RF) magnetron co‐sputtering on glass substrates. The C–Ni thin films were deposited under different deposition times, from 50 to 600 s, at room temperature. Atomic force microscopy was employed to characterize the 3‐D surface texture data in connection with the statistical, and fractal analyses. It has been found that up to 180 s the sputtering occurs in more metal content mode and in greater than 180 s it occurs in more non‐metal content mode. This behavior demonstrated a strong link between the structural and morphological properties of C–Ni composite films and facilitates a deeper understanding of structure/property relationships and surface defects in prepared samples. Furthermore, these findings can be applied to research on the mechanisms to prepare and control high‐quality C–Ni films.</abstract><cop>United States</cop><pub>Blackwell Publishing Ltd</pub><pmid>27639345</pmid><doi>10.1002/jemt.22779</doi><tpages>6</tpages></addata></record> |
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| ispartof | Microscopy research and technique, 2016-12, Vol.79 (12), p.1208-1213 |
| issn | 1059-910X 1097-0029 |
| language | eng |
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| source | Wiley-Blackwell Read & Publish Collection |
| subjects | carbon-nickel composite thin films Fractal analysis Glass Radio frequencies RF magnetron co-sputtering Samples Statistical methods Surface layer Texture Thin films three-dimensional surface micromorphology |
| title | Fractal features of carbon-nickel composite thin films |
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