Test Code Correction of Errors in the Information Storage Devices of Measurement Systems

A method of test-code correction of RAM errors is proposed. A linear code is used to detect new errors while the identification of hidden errors and the determination of the configuration (erroneous bits) of a multiple error and its correction are performed on the basis of the results of an analysis...

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Bibliographic Details
Published in:Measurement techniques 2016-12, Vol.59 (9), p.923-928
Main Authors: Pavlov, A. A., Burmistrov, A. A., Tsar’kov, A. N., Korsunskii, D. A., Sorokin, D. E., Neustroev, S. S., Robert, I. V.
Format: Article
Language:English
Subjects:
Analysis
Analytical Chemistry
Characterization and Evaluation of Materials
Codes
Computer programming
Computer storage device industry
Debugging
Devices
Error analysis
Error correction
Error correction & detection
Error detection
Fault tolerance
Hypotheses
Information storage
Linear codes
Measurement Science and Instrumentation
Measurement techniques
Measuring instruments
Physical Chemistry
Physics
Physics and Astronomy
Random access memory
Studies
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Description
Summary:A method of test-code correction of RAM errors is proposed. A linear code is used to detect new errors while the identification of hidden errors and the determination of the configuration (erroneous bits) of a multiple error and its correction are performed on the basis of the results of an analysis of a response reaction following a test action.
ISSN:0543-1972
1573-8906
DOI:10.1007/s11018-016-1068-0