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Test Code Correction of Errors in the Information Storage Devices of Measurement Systems
A method of test-code correction of RAM errors is proposed. A linear code is used to detect new errors while the identification of hidden errors and the determination of the configuration (erroneous bits) of a multiple error and its correction are performed on the basis of the results of an analysis...
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Published in: | Measurement techniques 2016-12, Vol.59 (9), p.923-928 |
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container_title | Measurement techniques |
container_volume | 59 |
creator | Pavlov, A. A. Burmistrov, A. A. Tsar’kov, A. N. Korsunskii, D. A. Sorokin, D. E. Neustroev, S. S. Robert, I. V. |
description | A method of test-code correction of RAM errors is proposed. A linear code is used to detect new errors while the identification of hidden errors and the determination of the configuration (erroneous bits) of a multiple error and its correction are performed on the basis of the results of an analysis of a response reaction following a test action. |
doi_str_mv | 10.1007/s11018-016-1068-0 |
format | article |
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subjects | Analysis Analytical Chemistry Characterization and Evaluation of Materials Codes Computer programming Computer storage device industry Debugging Devices Error analysis Error correction Error correction & detection Error detection Fault tolerance Hypotheses Information storage Linear codes Measurement Science and Instrumentation Measurement techniques Measuring instruments Physical Chemistry Physics Physics and Astronomy Random access memory Studies |
title | Test Code Correction of Errors in the Information Storage Devices of Measurement Systems |
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