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Test Code Correction of Errors in the Information Storage Devices of Measurement Systems

A method of test-code correction of RAM errors is proposed. A linear code is used to detect new errors while the identification of hidden errors and the determination of the configuration (erroneous bits) of a multiple error and its correction are performed on the basis of the results of an analysis...

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Published in:Measurement techniques 2016-12, Vol.59 (9), p.923-928
Main Authors: Pavlov, A. A., Burmistrov, A. A., Tsar’kov, A. N., Korsunskii, D. A., Sorokin, D. E., Neustroev, S. S., Robert, I. V.
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Language:English
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container_issue 9
container_start_page 923
container_title Measurement techniques
container_volume 59
creator Pavlov, A. A.
Burmistrov, A. A.
Tsar’kov, A. N.
Korsunskii, D. A.
Sorokin, D. E.
Neustroev, S. S.
Robert, I. V.
description A method of test-code correction of RAM errors is proposed. A linear code is used to detect new errors while the identification of hidden errors and the determination of the configuration (erroneous bits) of a multiple error and its correction are performed on the basis of the results of an analysis of a response reaction following a test action.
doi_str_mv 10.1007/s11018-016-1068-0
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subjects Analysis
Analytical Chemistry
Characterization and Evaluation of Materials
Codes
Computer programming
Computer storage device industry
Debugging
Devices
Error analysis
Error correction
Error correction & detection
Error detection
Fault tolerance
Hypotheses
Information storage
Linear codes
Measurement Science and Instrumentation
Measurement techniques
Measuring instruments
Physical Chemistry
Physics
Physics and Astronomy
Random access memory
Studies
title Test Code Correction of Errors in the Information Storage Devices of Measurement Systems
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