Surface composition deviation of Cu2ZnSnS4 derivative powdered samples

Powdered samples of Cu2ZnSnS4 derivatives prepared through a solid-state route were investigated by both bulk (electron dispersive X-ray spectroscopy) and surface-sensitive (X-ray photoelectron spectroscopy) methods. We observe a deviation in composition between the surface and the bulk for all non-...

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Bibliographic Details
Published in:Applied surface science 2014-06, Vol.303, p.107-110
Main Authors: HAREL, S, GUILLOT-DEUDON, C, CHOUBRAC, L, HAMON, J, LAFOND, A
Format: Article
Language:English
Subjects:
Bulk sampling
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Condensed matter: structure, mechanical and thermal properties
Cross-disciplinary physics: materials science
rheology
CZT
Derivatives
Deviation
Exact sciences and technology
Photoelectron spectroscopy
Physics
Spectroscopy
Thin films
X-rays
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Summary:Powdered samples of Cu2ZnSnS4 derivatives prepared through a solid-state route were investigated by both bulk (electron dispersive X-ray spectroscopy) and surface-sensitive (X-ray photoelectron spectroscopy) methods. We observe a deviation in composition between the surface and the bulk for all non-stoichiometric samples (both Cu-poor and Cu-rich). This behavior has already been observed for slightly Cu-poor CZTS thin films and is reminiscent of that of CIGSe compounds.
ISSN:0169-4332
1873-5584
DOI:10.1016/j.apsusc.2014.02.096