Visible Range Plasmonic Modes on Topological Insulator Nanostructures

Phase‐resolved real‐space imaging of localized plasmons in Bi1.5Sb0.5Te1.8Se1.2 topological insulator nanostructures is performed by scattering‐type scanning near‐field optical microscopy. Dipolar and higher order surface plasmon modes with well‐defined field amplitude and phase profiles are detecte...

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Bibliographic Details
Published in:Advanced optical materials 2017-02, Vol.5 (3), p.np-n/a
Main Authors: Dubrovkin, Alexander M., Adamo, Giorgio, Yin, Jun, Wang, Lan, Soci, Cesare, Wang, Qi Jie, Zheludev, Nikolay I.
Format: Article
Language:English
Subjects:
Amplitudes
chalcogenide topological insulator
Imaging
Insulators
Microscopes
Nanostructure
near‐field
Optics
Plasmonics
Plasmons
Scanning
SNOM
Topology
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Summary:Phase‐resolved real‐space imaging of localized plasmons in Bi1.5Sb0.5Te1.8Se1.2 topological insulator nanostructures is performed by scattering‐type scanning near‐field optical microscopy. Dipolar and higher order surface plasmon modes with well‐defined field amplitude and phase profiles are detected in the visible part of the spectrum.
ISSN:2195-1071
2195-1071
DOI:10.1002/adom.201600768