Optoelectronic Measurement System for a High-Temperature Dilatometer

A new optoelectronic measurement system for a high-temperature dilatometer for measuring the thermal expansion of solid samples over a wide temperature range from 1000–3000 K is described. A new method is proposed for measuring the elongation of a sample with corrections for the system parameters du...

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Bibliographic Details
Published in:Measurement techniques 2016-03, Vol.58 (12), p.1347-1353
Main Authors: Bronshtein, I. G., Inochkin, F. M., Kruglov, S. K., Kompan, T. A., Kondrat’ev, S. V., Korenev, A. S., Pukhov, N. F.
Format: Article
Language:English
Subjects:
Analytical Chemistry
Calibration
Characterization and Evaluation of Materials
Dilatometers
Elongation
Measurement Science and Instrumentation
Measurement techniques
Measuring instruments
Microscopes
Optoelectronics
Optoelectronics industry
Parameters
Physical Chemistry
Physics
Physics and Astronomy
Studies
Temperature
Thermal expansion
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Description
Summary:A new optoelectronic measurement system for a high-temperature dilatometer for measuring the thermal expansion of solid samples over a wide temperature range from 1000–3000 K is described. A new method is proposed for measuring the elongation of a sample with corrections for the system parameters during the measurement process. Experimental results are reported.
ISSN:0543-1972
1573-8906
DOI:10.1007/s11018-016-0897-1