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Optoelectronic Measurement System for a High-Temperature Dilatometer
A new optoelectronic measurement system for a high-temperature dilatometer for measuring the thermal expansion of solid samples over a wide temperature range from 1000–3000 K is described. A new method is proposed for measuring the elongation of a sample with corrections for the system parameters du...
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Published in: | Measurement techniques 2016-03, Vol.58 (12), p.1347-1353 |
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container_title | Measurement techniques |
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creator | Bronshtein, I. G. Inochkin, F. M. Kruglov, S. K. Kompan, T. A. Kondrat’ev, S. V. Korenev, A. S. Pukhov, N. F. |
description | A new optoelectronic measurement system for a high-temperature dilatometer for measuring the thermal expansion of solid samples over a wide temperature range from 1000–3000 K is described. A new method is proposed for measuring the elongation of a sample with corrections for the system parameters during the measurement process. Experimental results are reported. |
doi_str_mv | 10.1007/s11018-016-0897-1 |
format | article |
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subjects | Analytical Chemistry Calibration Characterization and Evaluation of Materials Dilatometers Elongation Measurement Science and Instrumentation Measurement techniques Measuring instruments Microscopes Optoelectronics Optoelectronics industry Parameters Physical Chemistry Physics Physics and Astronomy Studies Temperature Thermal expansion |
title | Optoelectronic Measurement System for a High-Temperature Dilatometer |
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