Scanning electron microscopy imaging of single-walled carbon nanotubes on substrates

Scanning electron microscopy （SEM） plays an indispensable role in nanoscience and nanotechnology because of its high efficiency and high spatial resolution in characterizing nanomaterials. Recent progress indicates that the contrast arising from different conductivities or bandgaps can be observed i...

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Bibliographic Details
Published in:Nano research 2017-05, Vol.10 (5), p.1804-1818
Main Authors: Li, Dongqi, Zhang, Jin, He, Yujun, Qin, Yan, Wei, Yang, Liu, Peng, Zhang, Lina, Wang, Jiaping, Li, Qunqing, Fan, Shoushan, Jiang, Kaili
Format: Article
Language:English
Subjects:
Acceleration
Atomic/Molecular Structure and Spectra
Biomedicine
Biotechnology
Charge materials
Chemistry and Materials Science
Condensed Matter Physics
Electric potential
Imaging
Materials Science
Nanoelectronics
Nanomaterials
Nanostructure
Nanotechnology
Nanotubes
Research Article
Scanning electron microscopy
Single wall carbon nanotubes
Spatial discrimination
Spatial resolution
Substrates
Surface charge
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Summary:Scanning electron microscopy （SEM） plays an indispensable role in nanoscience and nanotechnology because of its high efficiency and high spatial resolution in characterizing nanomaterials. Recent progress indicates that the contrast arising from different conductivities or bandgaps can be observed in SEM images if single-walled carbon nanotubes （SWCNTs） are placed on a substrate. In this study, we use SWCNTs on different substrates as model systems to perform SEM imaging of nanomaterials. Substantial SEM observations are conducted at both high and low acceleration voltages, leading to a comprehensive understanding of the effects of the imaging parameters and substrates on the material and surface-charge signals, as well as the SEM imaging. This unified picture of SEM imaging not only furthers our understanding of SEM images of SWCNTs on a variety of substrates but also provides a basis for developing new imaging recipes for other important nanomaterials used in nanoelectronics and nanophotonics.
ISSN:1998-0124
1998-0000
DOI:10.1007/s12274-017-1505-7