Focusing high-energy heavy ion microbeam system at the JAEA AVF cyclotron

Performance of a focusing high-energy heavy ion microbeam system in TIARA facility of JAEA Takasaki was tested for the spatial resolution and for the hitting accuracy at a target. A 260 MeV 20Ne 7+ ion beam was successfully extracted from the JAEA AVF cyclotron ( K = 110) with the smallest momentum...

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Bibliographic Details
Published in:Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Beam interactions with materials and atoms, 2007-07, Vol.260 (1), p.85-90
Main Authors: Oikawa, Masakazu, Satoh, Takahiro, Sakai, Takuro, Miyawaki, Nobumasa, Kashiwagi, Hirotsugu, Kurashima, Satoshi, Okumura, Susumu, Fukuda, Mitsuhiro, Yokota, Watalu, Kamiya, Tomihiro
Format: Article
Language:English
Subjects:
Biotechnology
Focusing lens
Microbeam
Single event phenomena
Single ion hit
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Summary:Performance of a focusing high-energy heavy ion microbeam system in TIARA facility of JAEA Takasaki was tested for the spatial resolution and for the hitting accuracy at a target. A 260 MeV 20Ne 7+ ion beam was successfully extracted from the JAEA AVF cyclotron ( K = 110) with the smallest momentum spread (Δ P/ P = δ) at present. The beam was focused by the microbeam lens system, and a spatial resolution of 260 MeV 20Ne 7+ microbeam was measured from a secondary electron image of a Cu grid which had sharp edges, and the hitting accuracy was estimated using single ion hitting onto a CR-39 film. From those two methods of measurement, both the spatial resolution and the hitting accuracy were evaluated at less than 1 μm.
ISSN:0168-583X
1872-9584
DOI:10.1016/j.nimb.2007.01.280