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Focusing high-energy heavy ion microbeam system at the JAEA AVF cyclotron
Performance of a focusing high-energy heavy ion microbeam system in TIARA facility of JAEA Takasaki was tested for the spatial resolution and for the hitting accuracy at a target. A 260 MeV 20Ne 7+ ion beam was successfully extracted from the JAEA AVF cyclotron ( K = 110) with the smallest momentum...
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| Published in: | Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Beam interactions with materials and atoms, 2007-07, Vol.260 (1), p.85-90 |
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| Main Authors: | , , , , , , , , , |
| Format: | Article |
| Language: | English |
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| cited_by | cdi_FETCH-LOGICAL-c397t-52e34448b41209a34d5fe103c19ac96c81c949d6f4b47743daf7b41935519533 |
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| cites | cdi_FETCH-LOGICAL-c397t-52e34448b41209a34d5fe103c19ac96c81c949d6f4b47743daf7b41935519533 |
| container_end_page | 90 |
| container_issue | 1 |
| container_start_page | 85 |
| container_title | Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms |
| container_volume | 260 |
| creator | Oikawa, Masakazu Satoh, Takahiro Sakai, Takuro Miyawaki, Nobumasa Kashiwagi, Hirotsugu Kurashima, Satoshi Okumura, Susumu Fukuda, Mitsuhiro Yokota, Watalu Kamiya, Tomihiro |
| description | Performance of a focusing high-energy heavy ion microbeam system in TIARA facility of JAEA Takasaki was tested for the spatial resolution and for the hitting accuracy at a target. A 260
MeV
20Ne
7+ ion beam was successfully extracted from the JAEA AVF cyclotron (
K
=
110) with the smallest momentum spread (Δ
P/
P
=
δ) at present. The beam was focused by the microbeam lens system, and a spatial resolution of 260
MeV
20Ne
7+ microbeam was measured from a secondary electron image of a Cu grid which had sharp edges, and the hitting accuracy was estimated using single ion hitting onto a CR-39 film. From those two methods of measurement, both the spatial resolution and the hitting accuracy were evaluated at less than 1
μm. |
| doi_str_mv | 10.1016/j.nimb.2007.01.280 |
| format | article |
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MeV
20Ne
7+ ion beam was successfully extracted from the JAEA AVF cyclotron (
K
=
110) with the smallest momentum spread (Δ
P/
P
=
δ) at present. The beam was focused by the microbeam lens system, and a spatial resolution of 260
MeV
20Ne
7+ microbeam was measured from a secondary electron image of a Cu grid which had sharp edges, and the hitting accuracy was estimated using single ion hitting onto a CR-39 film. From those two methods of measurement, both the spatial resolution and the hitting accuracy were evaluated at less than 1
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MeV
20Ne
7+ ion beam was successfully extracted from the JAEA AVF cyclotron (
K
=
110) with the smallest momentum spread (Δ
P/
P
=
δ) at present. The beam was focused by the microbeam lens system, and a spatial resolution of 260
MeV
20Ne
7+ microbeam was measured from a secondary electron image of a Cu grid which had sharp edges, and the hitting accuracy was estimated using single ion hitting onto a CR-39 film. From those two methods of measurement, both the spatial resolution and the hitting accuracy were evaluated at less than 1
μm.</description><subject>Biotechnology</subject><subject>Focusing lens</subject><subject>Microbeam</subject><subject>Single event phenomena</subject><subject>Single ion hit</subject><issn>0168-583X</issn><issn>1872-9584</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2007</creationdate><recordtype>article</recordtype><recordid>eNp9kMtqwzAQRUVpoWnaH-hKq-7sSpZkS9BNCEkfBLoJpTshy-NYwY9UcgL--yqk6w4Dszl34B6EHilJKaH58z7tXVemGSFFSmiaSXKFZlQWWaKE5NdoFiGZCMm-b9FdCHsSRzAxQ-_rwR6D63e4cbsmgR78bsINmNOE3dDjzlk_lGA6HKYwQofNiMcG8MditcCLrzW2k22H0Q_9PbqpTRvg4e_O0Xa92i7fks3n6_tysUksU8WYiAwY51yWnGZEGcYrUQMlzFJlrMqtpFZxVeU1L3lRcFaZuoisYkJQJRibo6fL24Mffo4QRt25YKFtTQ_DMWiqpMxZ3DnKLmAsEIKHWh-864yfNCX6LE3v9VmaPkvThOooLYZeLiGIDU4OvA7WQW-hch7sqKvB_Rf_BcZHdBg</recordid><startdate>20070701</startdate><enddate>20070701</enddate><creator>Oikawa, Masakazu</creator><creator>Satoh, Takahiro</creator><creator>Sakai, Takuro</creator><creator>Miyawaki, Nobumasa</creator><creator>Kashiwagi, Hirotsugu</creator><creator>Kurashima, Satoshi</creator><creator>Okumura, Susumu</creator><creator>Fukuda, Mitsuhiro</creator><creator>Yokota, Watalu</creator><creator>Kamiya, Tomihiro</creator><general>Elsevier B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7T7</scope><scope>8FD</scope><scope>C1K</scope><scope>FR3</scope><scope>P64</scope></search><sort><creationdate>20070701</creationdate><title>Focusing high-energy heavy ion microbeam system at the JAEA AVF cyclotron</title><author>Oikawa, Masakazu ; Satoh, Takahiro ; Sakai, Takuro ; Miyawaki, Nobumasa ; Kashiwagi, Hirotsugu ; Kurashima, Satoshi ; Okumura, Susumu ; Fukuda, Mitsuhiro ; Yokota, Watalu ; Kamiya, Tomihiro</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c397t-52e34448b41209a34d5fe103c19ac96c81c949d6f4b47743daf7b41935519533</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2007</creationdate><topic>Biotechnology</topic><topic>Focusing lens</topic><topic>Microbeam</topic><topic>Single event phenomena</topic><topic>Single ion hit</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Oikawa, Masakazu</creatorcontrib><creatorcontrib>Satoh, Takahiro</creatorcontrib><creatorcontrib>Sakai, Takuro</creatorcontrib><creatorcontrib>Miyawaki, Nobumasa</creatorcontrib><creatorcontrib>Kashiwagi, Hirotsugu</creatorcontrib><creatorcontrib>Kurashima, Satoshi</creatorcontrib><creatorcontrib>Okumura, Susumu</creatorcontrib><creatorcontrib>Fukuda, Mitsuhiro</creatorcontrib><creatorcontrib>Yokota, Watalu</creatorcontrib><creatorcontrib>Kamiya, Tomihiro</creatorcontrib><collection>CrossRef</collection><collection>Industrial and Applied Microbiology Abstracts (Microbiology A)</collection><collection>Technology Research Database</collection><collection>Environmental Sciences and Pollution Management</collection><collection>Engineering Research Database</collection><collection>Biotechnology and BioEngineering Abstracts</collection><jtitle>Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Oikawa, Masakazu</au><au>Satoh, Takahiro</au><au>Sakai, Takuro</au><au>Miyawaki, Nobumasa</au><au>Kashiwagi, Hirotsugu</au><au>Kurashima, Satoshi</au><au>Okumura, Susumu</au><au>Fukuda, Mitsuhiro</au><au>Yokota, Watalu</au><au>Kamiya, Tomihiro</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Focusing high-energy heavy ion microbeam system at the JAEA AVF cyclotron</atitle><jtitle>Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms</jtitle><date>2007-07-01</date><risdate>2007</risdate><volume>260</volume><issue>1</issue><spage>85</spage><epage>90</epage><pages>85-90</pages><issn>0168-583X</issn><eissn>1872-9584</eissn><abstract>Performance of a focusing high-energy heavy ion microbeam system in TIARA facility of JAEA Takasaki was tested for the spatial resolution and for the hitting accuracy at a target. A 260
MeV
20Ne
7+ ion beam was successfully extracted from the JAEA AVF cyclotron (
K
=
110) with the smallest momentum spread (Δ
P/
P
=
δ) at present. The beam was focused by the microbeam lens system, and a spatial resolution of 260
MeV
20Ne
7+ microbeam was measured from a secondary electron image of a Cu grid which had sharp edges, and the hitting accuracy was estimated using single ion hitting onto a CR-39 film. From those two methods of measurement, both the spatial resolution and the hitting accuracy were evaluated at less than 1
μm.</abstract><pub>Elsevier B.V</pub><doi>10.1016/j.nimb.2007.01.280</doi><tpages>6</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0168-583X |
| ispartof | Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 2007-07, Vol.260 (1), p.85-90 |
| issn | 0168-583X 1872-9584 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_19886386 |
| source | Elsevier |
| subjects | Biotechnology Focusing lens Microbeam Single event phenomena Single ion hit |
| title | Focusing high-energy heavy ion microbeam system at the JAEA AVF cyclotron |
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