Loading…

Publisher Correction: Integrating photonics with silicon nanoelectronics for the next generation of systems on a chip

In this Letter, owing to an error during the production process, the author affiliations were listed incorrectly. Affiliation number 5 (Colleges of Nanoscale Science and Engineering, State University of New York (SUNY)) was repeated, and affiliation numbers 6–8 were incorrect. In addition, the phras...

Full description

Saved in:
Bibliographic Details
Published in:Nature (London) 2018-08, Vol.560 (7716), p.E4-E4
Main Authors: Atabaki, Amir H., Moazeni, Sajjad, Pavanello, Fabio, Gevorgyan, Hayk, Notaros, Jelena, Alloatti, Luca, Wade, Mark T., Sun, Chen, Kruger, Seth A., Meng, Huaiyu, Qubaisi, Kenaish Al, Wang, Imbert, Zhang, Bohan, Khilo, Anatol, Baiocco, Christopher V., Popović, Miloš A., Stojanović, Vladimir M., Ram, Rajeev J.
Format: Article
Language:English
Subjects:
Citations: Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:In this Letter, owing to an error during the production process, the author affiliations were listed incorrectly. Affiliation number 5 (Colleges of Nanoscale Science and Engineering, State University of New York (SUNY)) was repeated, and affiliation numbers 6–8 were incorrect. In addition, the phrase “two oxide thickness variants” should have been “two gate oxide thickness variants”. These errors have all been corrected online.
ISSN:0028-0836
1476-4687
DOI:10.1038/s41586-018-0247-3