High-resolution stigmatic spectrograph for a wavelength range of 12.5-30 nm

We describe a broadband (12.5-30 nm) extreme ultraviolet (XUV) spectrograph, which is stigmatic throughout its operating range. The instrument employs a near-normal-incidence aperiodic Mo/Si multilayer mirror and a grazing-incidence plane varied line-space (VLS) grating. Strict stigmatism is fulfill...

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Bibliographic Details
Published in:Optics express 2018-07, Vol.26 (15), p.19009-19019
Main Authors: Shatokhin, A N, Kolesnikov, A O, Sasorov, P V, Vishnyakov, E A, Ragozin, E N
Format: Article
Language:English
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Summary:We describe a broadband (12.5-30 nm) extreme ultraviolet (XUV) spectrograph, which is stigmatic throughout its operating range. The instrument employs a near-normal-incidence aperiodic Mo/Si multilayer mirror and a grazing-incidence plane varied line-space (VLS) grating. Strict stigmatism is fulfilled simultaneously at two wavelengths and the condition of practical stigmatism is fulfilled over two octaves in wavelength. The vertically space-resolved line spectra of multiple charge ions from laser plasma were recorded to demonstrate a spectral resolving power of 10 and a spatial resolution of ~26 μm, both figures corresponding to two detector pixels. The electron density was evaluated from the Stark broadening of the Balmer line Hβ (135 Å) of C VI in the plasma excited by 0.5 J, 8 ns, 1.06 μm pulses.
ISSN:1094-4087
1094-4087
DOI:10.1364/oe.26.019009