Precise measurements of spectral line profiles

We present a method of precise measurements of spectral line profiles that was elaborated and tested on the Main Stellar Spectrograph (MSS) of the 6-m BTA telescope. The method allows discarding corrections for flat field. To take account of inhomogeneity of the CCD chip sensitivity, two spectra are...

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Bibliographic Details
Published in:Astrophysical bulletin 2009-10, Vol.64 (4), p.401-402
Main Author: Chountonov, G. A.
Format: Article
Language:English
Subjects:
Astronomy
Astrophysics
Astrophysics and Cosmology
Measurement techniques
Physics
Physics and Astronomy
Research methodology
Spectrum analysis
Online Access:Get full text
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Summary:We present a method of precise measurements of spectral line profiles that was elaborated and tested on the Main Stellar Spectrograph (MSS) of the 6-m BTA telescope. The method allows discarding corrections for flat field. To take account of inhomogeneity of the CCD chip sensitivity, two spectra are recorded, shifted against each other along the dispersion by one column. Recurrent ratios between the photo responses of the CCD pixels let us determine their relative sensitivity and correct the line profiles. To eliminate various instability effects, the spectra are registered with the use of a cyclic shift procedure along the dispersion, and a synchronous electronic image transfer across the spectrum dispersion (along the CCD matrix columns).
ISSN:1990-3413
1990-3421
DOI:10.1134/S1990341309040105