Temporal properties of He I 1083 nm dark points

The intensity of a sample of large, high-contrast and isolated dark points has been observed with full-disk images in the light of Hei 1083 nm from the Chromospheric Helium line Intensity Photometer (CHIP) on Mauna Loa, Hawaii. Temporal variations in the intensity encompassing a broad range of time...

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Bibliographic Details
Published in:Solar physics 2000-01, Vol.191 (1), p.85-96
Main Authors: Macqueen, Rm, Hendrickson, Ma, Woods, Jc, Lecinski, Ar, Elmore, Df, White, Or
Format: Article
Language:English
Subjects:
Dark matter
Helium
Photometers
Solar flares
Solar physics
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Summary:The intensity of a sample of large, high-contrast and isolated dark points has been observed with full-disk images in the light of Hei 1083 nm from the Chromospheric Helium line Intensity Photometer (CHIP) on Mauna Loa, Hawaii. Temporal variations in the intensity encompassing a broad range of time scales have been recorded. Long-term changes in the intensity, although highly variable, are characterized by e-folding times on the order of 5 h. Superposed on these variations are frequent intensity variations, which occur over time scales ranging from the typical observing cadence of 3 min, to tens of minutes. Microflares-involving intensity changes of at least 50% over periods of minutes are observed frequently. Rapid cadence (1/2 min) observations reveal differences between rise and decay times and shorter-term variations in the intensity profiles of these microflares.[PUBLICATION ABSTRACT]
ISSN:0038-0938
1573-093X
DOI:10.1023/A:1005288414802