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Halogen bonding in UiO-66 frameworks promotes superior chemical warfare agent simulant degradation
Herein, a series of halogenated UiO-66 derivatives was synthesized and analyzed for the breakdown of the chemical warfare agent simulant dimethyl-4-nitrophenyl phosphate (DMNP) to analyze ligand effects. UiO-66-I degrades DMNP at a rate four times faster than the most active previously reported MOFs...
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Published in: | Chemical communications (Cambridge, England) England), 2019-03, Vol.55 (24), p.3481-3484 |
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container_title | Chemical communications (Cambridge, England) |
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creator | Kalaj, Mark Momeni, Mohammad R Bentz, Kyle C Barcus, Kyle S Palomba, Joseph M Paesani, Francesco Cohen, Seth M |
description | Herein, a series of halogenated UiO-66 derivatives was synthesized and analyzed for the breakdown of the chemical warfare agent simulant dimethyl-4-nitrophenyl phosphate (DMNP) to analyze ligand effects. UiO-66-I degrades DMNP at a rate four times faster than the most active previously reported MOFs. MOF defects were quantified and ruled out as a cause for increased activity. Theoretical calculations suggest the enhanced activity of UiO-66-I originates from halogen bonding of the iodine atom to the phosphoester linkage allowing for more rapid hydrolysis of the P-O bond.
Herein, a series of halogenated UiO-66 derivatives was synthesized and analyzed for the breakdown of the CWA simulant dimethyl-4-nitrophenyl phosphate (DMNP) to analyze ligand effects. |
doi_str_mv | 10.1039/c9cc00642g |
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subjects | Bonding agents Chemical synthesis Chemical warfare Iodine Metal-organic frameworks NMR Nuclear magnetic resonance Organic chemistry |
title | Halogen bonding in UiO-66 frameworks promotes superior chemical warfare agent simulant degradation |
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