Evaluation of spatial and temporal resolution on in situ annealing aberration-corrected transmission electron microscopy with proportional-integral-differential controller

The in situ annealing observation in transmission electron microscope (TEM) is one of the effective methods for imaging thermally induced microstructural changes. For applying this dynamical characterization to bulk samples fabricated by ion-milling, electro-polishing or focused ion beam (FIB) mill,...

Full description

Saved in:
Bibliographic Details
Published in:Microscopy 2019-06, Vol.68 (3), p.271-278
Main Authors: Shimada, Yusuke, Yoshida, Kenta, Inoue, Koji, Shiraishi, Takahisa, Kiguchi, Takanori, Nagai, Yasuyoshi, Konno, Toyohiko J
Format: Article
Language:English
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c293t-47acbb0a3925139687972d25e3450c0155cfebd22aa59679d504a5719bb424cc3
cites cdi_FETCH-LOGICAL-c293t-47acbb0a3925139687972d25e3450c0155cfebd22aa59679d504a5719bb424cc3
container_end_page 278
container_issue 3
container_start_page 271
container_title Microscopy
container_volume 68
creator Shimada, Yusuke
Yoshida, Kenta
Inoue, Koji
Shiraishi, Takahisa
Kiguchi, Takanori
Nagai, Yasuyoshi
Konno, Toyohiko J
description The in situ annealing observation in transmission electron microscope (TEM) is one of the effective methods for imaging thermally induced microstructural changes. For applying this dynamical characterization to bulk samples fabricated by ion-milling, electro-polishing or focused ion beam (FIB) mill, it is generally needed to use a heating-pot type system. We here report an initial trial to improve the spatial and temporal resolution during the in-situ annealing observation of bulk samples using a spherical aberration corrected (AC) TEM with a new thermal control unit. The information limit of 1.5 Å and the point resolution of 2.0 Å are achieved under isothermal annealing at 350°C, which is the same resolution at room temperature, and it is affected strongly of sample drift by the temperature variation. The sample is heated at a heating rate of +1.0°C/s, the drift distance observed by a TV readout speed CCD camera is less than 2.0 Å/s.
doi_str_mv 10.1093/jmicro/dfz010
format article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_2188984768</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2188984768</sourcerecordid><originalsourceid>FETCH-LOGICAL-c293t-47acbb0a3925139687972d25e3450c0155cfebd22aa59679d504a5719bb424cc3</originalsourceid><addsrcrecordid>eNo9UctOxSAUJEajRl26NSzdVHm2ZWmMr8TEja4bSk-v3FCo0Gr0l_xJubcqGwYyM2dOBqFTSi4oUfxyPVgTw2XXfxFKdtAhI5IUsiJ09w-Xqj5AJymtST61pESU--iAk1pwIsQh-r55127Wkw0ehx6nMUPtsPYdnmAYQ8yPCCm4eaF4bD1OdpozxYN21q-wbiHGrUVhQoxgJsjqqH0abEobGbj8GTPY5k0mjJ_4w06veIwhz9hItSusn2CVBxad7XuI4LdRTPBZ6hzEY7TXa5fg5Pc-Qi-3N8_X98Xj093D9dVjYZjiUyEqbdqWaK6YpFyVdaUq1jEJXEhiCJXS9NB2jGktVVmpThKhZUVV2womjOFH6HzxzeneZkhTk_cw4Jz2EObUMFrXqhZVWWdqsVA3a6UIfTNGO-j42VDSbCpqloqapaLMP_u1ntsBun_2XyH8B2fflJ0</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2188984768</pqid></control><display><type>article</type><title>Evaluation of spatial and temporal resolution on in situ annealing aberration-corrected transmission electron microscopy with proportional-integral-differential controller</title><source>Oxford Journals Online</source><creator>Shimada, Yusuke ; Yoshida, Kenta ; Inoue, Koji ; Shiraishi, Takahisa ; Kiguchi, Takanori ; Nagai, Yasuyoshi ; Konno, Toyohiko J</creator><creatorcontrib>Shimada, Yusuke ; Yoshida, Kenta ; Inoue, Koji ; Shiraishi, Takahisa ; Kiguchi, Takanori ; Nagai, Yasuyoshi ; Konno, Toyohiko J</creatorcontrib><description>The in situ annealing observation in transmission electron microscope (TEM) is one of the effective methods for imaging thermally induced microstructural changes. For applying this dynamical characterization to bulk samples fabricated by ion-milling, electro-polishing or focused ion beam (FIB) mill, it is generally needed to use a heating-pot type system. We here report an initial trial to improve the spatial and temporal resolution during the in-situ annealing observation of bulk samples using a spherical aberration corrected (AC) TEM with a new thermal control unit. The information limit of 1.5 Å and the point resolution of 2.0 Å are achieved under isothermal annealing at 350°C, which is the same resolution at room temperature, and it is affected strongly of sample drift by the temperature variation. The sample is heated at a heating rate of +1.0°C/s, the drift distance observed by a TV readout speed CCD camera is less than 2.0 Å/s.</description><identifier>ISSN: 2050-5698</identifier><identifier>EISSN: 2050-5701</identifier><identifier>DOI: 10.1093/jmicro/dfz010</identifier><identifier>PMID: 30843044</identifier><language>eng</language><publisher>England</publisher><ispartof>Microscopy, 2019-06, Vol.68 (3), p.271-278</ispartof><rights>The Author(s) 2019. Published by Oxford University Press on behalf of The Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oup.com.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c293t-47acbb0a3925139687972d25e3450c0155cfebd22aa59679d504a5719bb424cc3</citedby><cites>FETCH-LOGICAL-c293t-47acbb0a3925139687972d25e3450c0155cfebd22aa59679d504a5719bb424cc3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27898,27899</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/30843044$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Shimada, Yusuke</creatorcontrib><creatorcontrib>Yoshida, Kenta</creatorcontrib><creatorcontrib>Inoue, Koji</creatorcontrib><creatorcontrib>Shiraishi, Takahisa</creatorcontrib><creatorcontrib>Kiguchi, Takanori</creatorcontrib><creatorcontrib>Nagai, Yasuyoshi</creatorcontrib><creatorcontrib>Konno, Toyohiko J</creatorcontrib><title>Evaluation of spatial and temporal resolution on in situ annealing aberration-corrected transmission electron microscopy with proportional-integral-differential controller</title><title>Microscopy</title><addtitle>Microscopy (Oxf)</addtitle><description>The in situ annealing observation in transmission electron microscope (TEM) is one of the effective methods for imaging thermally induced microstructural changes. For applying this dynamical characterization to bulk samples fabricated by ion-milling, electro-polishing or focused ion beam (FIB) mill, it is generally needed to use a heating-pot type system. We here report an initial trial to improve the spatial and temporal resolution during the in-situ annealing observation of bulk samples using a spherical aberration corrected (AC) TEM with a new thermal control unit. The information limit of 1.5 Å and the point resolution of 2.0 Å are achieved under isothermal annealing at 350°C, which is the same resolution at room temperature, and it is affected strongly of sample drift by the temperature variation. The sample is heated at a heating rate of +1.0°C/s, the drift distance observed by a TV readout speed CCD camera is less than 2.0 Å/s.</description><issn>2050-5698</issn><issn>2050-5701</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><recordid>eNo9UctOxSAUJEajRl26NSzdVHm2ZWmMr8TEja4bSk-v3FCo0Gr0l_xJubcqGwYyM2dOBqFTSi4oUfxyPVgTw2XXfxFKdtAhI5IUsiJ09w-Xqj5AJymtST61pESU--iAk1pwIsQh-r55127Wkw0ehx6nMUPtsPYdnmAYQ8yPCCm4eaF4bD1OdpozxYN21q-wbiHGrUVhQoxgJsjqqH0abEobGbj8GTPY5k0mjJ_4w06veIwhz9hItSusn2CVBxad7XuI4LdRTPBZ6hzEY7TXa5fg5Pc-Qi-3N8_X98Xj093D9dVjYZjiUyEqbdqWaK6YpFyVdaUq1jEJXEhiCJXS9NB2jGktVVmpThKhZUVV2womjOFH6HzxzeneZkhTk_cw4Jz2EObUMFrXqhZVWWdqsVA3a6UIfTNGO-j42VDSbCpqloqapaLMP_u1ntsBun_2XyH8B2fflJ0</recordid><startdate>20190601</startdate><enddate>20190601</enddate><creator>Shimada, Yusuke</creator><creator>Yoshida, Kenta</creator><creator>Inoue, Koji</creator><creator>Shiraishi, Takahisa</creator><creator>Kiguchi, Takanori</creator><creator>Nagai, Yasuyoshi</creator><creator>Konno, Toyohiko J</creator><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope></search><sort><creationdate>20190601</creationdate><title>Evaluation of spatial and temporal resolution on in situ annealing aberration-corrected transmission electron microscopy with proportional-integral-differential controller</title><author>Shimada, Yusuke ; Yoshida, Kenta ; Inoue, Koji ; Shiraishi, Takahisa ; Kiguchi, Takanori ; Nagai, Yasuyoshi ; Konno, Toyohiko J</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c293t-47acbb0a3925139687972d25e3450c0155cfebd22aa59679d504a5719bb424cc3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Shimada, Yusuke</creatorcontrib><creatorcontrib>Yoshida, Kenta</creatorcontrib><creatorcontrib>Inoue, Koji</creatorcontrib><creatorcontrib>Shiraishi, Takahisa</creatorcontrib><creatorcontrib>Kiguchi, Takanori</creatorcontrib><creatorcontrib>Nagai, Yasuyoshi</creatorcontrib><creatorcontrib>Konno, Toyohiko J</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><jtitle>Microscopy</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Shimada, Yusuke</au><au>Yoshida, Kenta</au><au>Inoue, Koji</au><au>Shiraishi, Takahisa</au><au>Kiguchi, Takanori</au><au>Nagai, Yasuyoshi</au><au>Konno, Toyohiko J</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Evaluation of spatial and temporal resolution on in situ annealing aberration-corrected transmission electron microscopy with proportional-integral-differential controller</atitle><jtitle>Microscopy</jtitle><addtitle>Microscopy (Oxf)</addtitle><date>2019-06-01</date><risdate>2019</risdate><volume>68</volume><issue>3</issue><spage>271</spage><epage>278</epage><pages>271-278</pages><issn>2050-5698</issn><eissn>2050-5701</eissn><abstract>The in situ annealing observation in transmission electron microscope (TEM) is one of the effective methods for imaging thermally induced microstructural changes. For applying this dynamical characterization to bulk samples fabricated by ion-milling, electro-polishing or focused ion beam (FIB) mill, it is generally needed to use a heating-pot type system. We here report an initial trial to improve the spatial and temporal resolution during the in-situ annealing observation of bulk samples using a spherical aberration corrected (AC) TEM with a new thermal control unit. The information limit of 1.5 Å and the point resolution of 2.0 Å are achieved under isothermal annealing at 350°C, which is the same resolution at room temperature, and it is affected strongly of sample drift by the temperature variation. The sample is heated at a heating rate of +1.0°C/s, the drift distance observed by a TV readout speed CCD camera is less than 2.0 Å/s.</abstract><cop>England</cop><pmid>30843044</pmid><doi>10.1093/jmicro/dfz010</doi><tpages>8</tpages></addata></record>
fulltext fulltext
identifier ISSN: 2050-5698
ispartof Microscopy, 2019-06, Vol.68 (3), p.271-278
issn 2050-5698
2050-5701
language eng
recordid cdi_proquest_miscellaneous_2188984768
source Oxford Journals Online
title Evaluation of spatial and temporal resolution on in situ annealing aberration-corrected transmission electron microscopy with proportional-integral-differential controller
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-03-04T05%3A42%3A58IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Evaluation%20of%20spatial%20and%20temporal%20resolution%20on%20in%20situ%20annealing%20aberration-corrected%20transmission%20electron%20microscopy%20with%20proportional-integral-differential%20controller&rft.jtitle=Microscopy&rft.au=Shimada,%20Yusuke&rft.date=2019-06-01&rft.volume=68&rft.issue=3&rft.spage=271&rft.epage=278&rft.pages=271-278&rft.issn=2050-5698&rft.eissn=2050-5701&rft_id=info:doi/10.1093/jmicro/dfz010&rft_dat=%3Cproquest_cross%3E2188984768%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c293t-47acbb0a3925139687972d25e3450c0155cfebd22aa59679d504a5719bb424cc3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=2188984768&rft_id=info:pmid/30843044&rfr_iscdi=true