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High-performance visible to near-infrared photodetectors by using (Cd,Zn)Te single crystal

The authors report on a high-performance metal-semiconductor-metal (MSM) photodetector fabricated on the Cd Zn Te single crystal with the photoresponse from visible to near infrared region. Benefitting from the high-quality single crystallization, an ultra-low dark current of ~10 A was obtained at a...

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Bibliographic Details
Published in:Optics express 2019-03, Vol.27 (6), p.8935-8942
Main Authors: Ren, Bing, Zhang, Jijun, Liao, Meiyong, Huang, Jian, Sang, Liwen, Koide, Yasuo, Wang, Linjun
Format: Article
Language:English
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Summary:The authors report on a high-performance metal-semiconductor-metal (MSM) photodetector fabricated on the Cd Zn Te single crystal with the photoresponse from visible to near infrared region. Benefitting from the high-quality single crystallization, an ultra-low dark current of ~10 A was obtained at a high applied voltage of 10 V, leading to a photo-to-dark-current ratio of more than 10 at 700 nm light illumination. The highest responsivity is estimated to be 1.43 A/W with a specific detectivity of 3.31 × 10 Jones at 10 V at a relatively lower injection power density. The discrimination ratio between the near infrared region of 800 nm and 900 nm is almost 10 , which is high enough for the accurate spectra selectivity. The MSM photodetector also exhibits a fast response speed of ~800 μs and extremely low persistent photoconductivity (PPC), while the PPC is inhibited at high temperatures.
ISSN:1094-4087
1094-4087
DOI:10.1364/oe.27.008935