Complex refractive index measurement for atomic-layer materials via surface plasmon resonance holographic microscopy

The optical characterization of atomic-layer materials is significant for the clarification of fundamental physical properties of newly emerging nanomaterials. Here we propose to utilize the surface plasmon resonance (SPR) holographic microscopy to measure the complex refractive index (RI) of atomic...

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Bibliographic Details
Published in:Optics letters 2019-06, Vol.44 (12), p.2982-2985
Main Authors: Dai, Siqing, Lu, Hua, Zhang, Jiwei, Shi, Yuping, Dou, Jiazhen, Di, Jianglei, Zhao, Jianlin
Format: Article
Language:English
Subjects:
Chemical vapor deposition
Graphene
Microscopy
Nanomaterials
Optical properties
Organic chemistry
Physical properties
Refractivity
Surface plasmon resonance
Two dimensional materials
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Summary:The optical characterization of atomic-layer materials is significant for the clarification of fundamental physical properties of newly emerging nanomaterials. Here we propose to utilize the surface plasmon resonance (SPR) holographic microscopy to measure the complex refractive index (RI) of atomic-layer materials (i.e., graphene). We unambiguously determine the complex RI of single-layer graphene and few-layer graphene by fitting the measured reflection phase shift difference with theoretical values under the five-layer SPR model. The measurement results of the graphene layer grown by chemical vapor deposition at the visible range agree with the previous reports. Our method offers a cost-effective and robust avenue to characterize the complex RI of atomic-layer materials with distinct optical absorption, particularly the two-dimensional materials.
ISSN:0146-9592
1539-4794
DOI:10.1364/OL.44.002982