Optical method for determining the grain resistivity in ZnO-based ceramic varistors

An optical technique for evaluating the grain resistivity in ZnO ceramic varistors is described. It is based on the existence of a rather sharp minimum in the infrared reflectance whose wavelength position depends on the free-electron density and hence on the ZnO grain resistivity. Values of resisti...

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Bibliographic Details
Published in:Journal of applied physics 1976-01, Vol.47 (3), p.1112-1116
Main Authors: Philipp, H. R., Levinson, Lionel M.
Format: Article
Language:English
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Summary:An optical technique for evaluating the grain resistivity in ZnO ceramic varistors is described. It is based on the existence of a rather sharp minimum in the infrared reflectance whose wavelength position depends on the free-electron density and hence on the ZnO grain resistivity. Values of resistivity obtained from optical measurements are in good agreement with those obtained using alternative evaluation techniques.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.322734