Simulation of electromigration noise in polycrystalline metal stripes

We have performed the Monte Carlo simulation of electromigration noise in polycrystalline metal stripes, based on a two-dimensional model which takes into account both the role of grain boundaries and the effect of current density redistribution in the stripe. The noise spectrum has the characterist...

Full description

Saved in:
Bibliographic Details
Published in:Microelectronics and reliability 2000-11, Vol.40 (11), p.1955-1958
Main Authors: Di Pascoli, S, Iannaccone, G
Format: Article
Language:English
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:We have performed the Monte Carlo simulation of electromigration noise in polycrystalline metal stripes, based on a two-dimensional model which takes into account both the role of grain boundaries and the effect of current density redistribution in the stripe. The noise spectrum has the characteristic 1/ f γ ( γ≈2) behavior, and the total noise power strongly increases with increasing damage of the stripe. The results of the simulation exhibit a substantial qualitative agreement with experiments, giving confidence in the capability of our model of including the relevant physics involved in the failure process.
ISSN:0026-2714
1872-941X
DOI:10.1016/S0026-2714(00)00054-8