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X-ray photoelectron and ultraviolet photoelectron studies of the oxidation and hydriding of zirconium
X-ray photoelectron spectroscopy (XPS) has been used to follow the initial stages of oxidation of clean Zr(0001) and polycrystalline Zr surfaces at 295 K. Limiting oxide thicknesses were estimated from the Zr 3d spectra to be in the range 2–5 nm. Xps and ultraviolet photoelectron spectroscopic (UPS)...
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Published in: | Journal of nuclear materials 1982-06, Vol.107 (2-3), p.151-158 |
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Main Author: | |
Format: | Article |
Language: | English |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | X-ray photoelectron spectroscopy (XPS) has been used to follow the initial stages of oxidation of clean Zr(0001) and polycrystalline Zr surfaces at 295 K. Limiting oxide thicknesses were estimated from the Zr 3d spectra to be in the range 2–5 nm. Xps and ultraviolet photoelectron spectroscopic (UPS) spectra of zirconium surfaces exposed to hydrogen were compared with those from an electrolytically-charged Zr-2.5 wt.% Nb alloy hydride. Considerable differences between the spectra were observed, but the data support a mechanism of charge transfer from Zr to the site of adsorbed hydrogen or to hydrogen atoms in hydride. |
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ISSN: | 0022-3115 1873-4820 |
DOI: | 10.1016/0022-3115(82)90417-2 |