Gypsum: an environment-friendly, inexpensive and robust height calibration standard at nanometer-scale for atomic force microscopy

Gypsum is an Earth-abundant mineral with enormous applications in agriculture and civil engineering. Here, we show it is also an excellent height calibration standard alternative for atomic force microscopy (AFM). Using plain water as etchant, gypsum flakes readily review 0.75 nm tall terraces which...

Full description

Saved in:
Bibliographic Details
Published in:Nanotechnology 2020-03, Vol.31 (11), p.115704-115704
Main Authors: Barboza, Ana P M, Santos, Joyce C C, Silva-Pinto, Elisangela, Neves, Bernardo R A
Format: Article
Language:English
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Gypsum is an Earth-abundant mineral with enormous applications in agriculture and civil engineering. Here, we show it is also an excellent height calibration standard alternative for atomic force microscopy (AFM). Using plain water as etchant, gypsum flakes readily review 0.75 nm tall terraces which are easy to image (lateral dimensions from tens to hundreds of nanometers) and robust against time in ambient conditions. Therefore, the present work demonstrates a new height standard alternative which is easily-available for all AFM microscopists around the world.
ISSN:0957-4484
1361-6528
DOI:10.1088/1361-6528/ab5ded