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Microanalytical investigation of sintered SiC. II: Study of the grain boundaries of sintered SiC by high resolution Auger electron spectroscopy

For part I, see Ceram. Abstr., 1983, 62 [5-6] 62-04700A.

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Bibliographic Details
Published in:Journal of materials science 1983-10, Vol.18 (10), p.3154-3160
Main Authors: HAMMINGER, R, GRATHWOHL, G, THUMMLER, F
Format: Article
Language:English
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Description
Summary:For part I, see Ceram. Abstr., 1983, 62 [5-6] 62-04700A.
ISSN:0022-2461
1573-4803