Examination of Al-Cu Films During the Galvanostatic Formation of Anodic Oxide. Pt. 2. Rutherford Backscattering and Depth Profiling

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Bibliographic Details
Published in:Journal of the Electrochemical Society 1978-06, Vol.125 (6), p.915-919
Main Authors: Strehblow, H-H, Melliar-Smith, C M, Augustyniak, W M
Format: Article
Language:English
Online Access:Get full text
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ISSN:0013-4651