High‐resolution scanning transmission electron microscope at Johns Hopkins

The scanning transmission electron microscope constructed at Johns Hopkins follows the general layout of the first instrument at the University of Chicago. It is currently operating at 50 kV with a resolution of about 3 Å. Its detector scheme consists of scintillation crystals coupled to photomultip...

Full description

Saved in:
Bibliographic Details
Published in:Review of scientific instruments 1979-04, Vol.50 (4), p.403-410
Main Authors: Wiggins, J. W., Zubin, J. A., Beer, M.
Format: Article
Language:English
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The scanning transmission electron microscope constructed at Johns Hopkins follows the general layout of the first instrument at the University of Chicago. It is currently operating at 50 kV with a resolution of about 3 Å. Its detector scheme consists of scintillation crystals coupled to photomultipliers in such a way as to eliminate introduction of unnecessary statistical noise. A unique alignment scheme utilizes the spherical aberration of the objective lens.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.1135840