Enhanced Raman scattering from aluminum films

Raman spectra from Al films prepared and investigated in an ultrahigh-vacuum apparatus are presented. Although the Al film was not intentionally exposed in a controlled way to any gas, a highly structured and relatively intense spectrum was observed reproducibly. Even after improving the conditions...

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Bibliographic Details
Published in:Surface science 1982-09, Vol.121 (1), p.L541-L544
Main Authors: Lopez-Rios, T., Pettenkofer, C., Pockrand, I., Otto, A.
Format: Article
Language:English
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Summary:Raman spectra from Al films prepared and investigated in an ultrahigh-vacuum apparatus are presented. Although the Al film was not intentionally exposed in a controlled way to any gas, a highly structured and relatively intense spectrum was observed reproducibly. Even after improving the conditions of evaporation, the four peaks at 560, 845, 930, 1110/cm were observed with unchanged intensity. It is concluded that surface enhanced scattering is also observed on an Al substrate. The origin of the scattering is discussed. 21 ref.--EAA/AF.
ISSN:0039-6028
1879-2758
DOI:10.1016/0039-6028(82)90231-X