Enhanced Raman scattering from aluminum films

Raman spectra from Al films prepared and investigated in an ultrahigh-vacuum apparatus are presented. Although the Al film was not intentionally exposed in a controlled way to any gas, a highly structured and relatively intense spectrum was observed reproducibly. Even after improving the conditions...

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Published in:Surface science 1982-09, Vol.121 (1), p.L541-L544
Main Authors: Lopez-Rios, T., Pettenkofer, C., Pockrand, I., Otto, A.
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Language:English
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cited_by cdi_FETCH-LOGICAL-c335t-3fb58b8dd49e41b7f9cc1275015974c74bde5b79dc53097b5bf81e311b0846b43
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creator Lopez-Rios, T.
Pettenkofer, C.
Pockrand, I.
Otto, A.
description Raman spectra from Al films prepared and investigated in an ultrahigh-vacuum apparatus are presented. Although the Al film was not intentionally exposed in a controlled way to any gas, a highly structured and relatively intense spectrum was observed reproducibly. Even after improving the conditions of evaporation, the four peaks at 560, 845, 930, 1110/cm were observed with unchanged intensity. It is concluded that surface enhanced scattering is also observed on an Al substrate. The origin of the scattering is discussed. 21 ref.--EAA/AF.
doi_str_mv 10.1016/0039-6028(82)90231-X
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title Enhanced Raman scattering from aluminum films
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