Observation of a marker shift in a Cu-Sn thin film diffusion couple by Auger electron spectroscopy methods

A Kirkendall-type experiment in bimetallic CuSn thin film specimens, combining the use of a discontinuous film of inert molybdenum markers and the Auger electron spectroscopy depth profiling method, is described. An observed shift of the molybdenum markers into the tin side of a diffused Sn/Mo/Cu f...

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Bibliographic Details
Published in:Thin solid films 1981-11, Vol.86 (1), p.43-47
Main Authors: Chopra, R., Ohring, M., Oswald, R.S.
Format: Article
Language:English
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Summary:A Kirkendall-type experiment in bimetallic CuSn thin film specimens, combining the use of a discontinuous film of inert molybdenum markers and the Auger electron spectroscopy depth profiling method, is described. An observed shift of the molybdenum markers into the tin side of a diffused Sn/Mo/Cu film structure is discussed in terms of three possible mechanisms: (i) Kirkendall-type motion, (ii) interface drag of markers and (iii) gettering by surface oxygen. It is proposed that the observation of marker distribution by high resolution transmission electron microscopy can provide direct evidence for a grain boundary Kirkendall effect.
ISSN:0040-6090
1879-2731
DOI:10.1016/0040-6090(81)90156-5