Electron-phonon coupling and monopolar charge fluctuations in intermediate valence TmSe

Polarized Raman spectra of intermediate valence Tm xSe (x=0.95, 1.00, 1.01) have been measured. The scattering intensity is interpreted in terms of a one-phonon density of states weighted by the electron-phonon matrix element. The latter is described in a model of phonon-induced local, intraionic ch...

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Bibliographic Details
Published in:Solid state communications 1981-01, Vol.39 (9), p.965-968
Main Authors: Stüβer, N., Barth, M., Güntherodt, G., Jayaraman, A.
Format: Article
Language:English
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Summary:Polarized Raman spectra of intermediate valence Tm xSe (x=0.95, 1.00, 1.01) have been measured. The scattering intensity is interpreted in terms of a one-phonon density of states weighted by the electron-phonon matrix element. The latter is described in a model of phonon-induced local, intraionic charge deformabilities. In the symmetry-analysed Raman intensities of A 1g character, two peaks near 8.8meV and 21.9meV are attributed to monopolar charge deformations of the valence-fluctuating Tm ions.
ISSN:0038-1098
1879-2766
DOI:10.1016/0038-1098(81)90066-1