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Fast diffraction‐enhanced imaging using continuous sample rotation and analyzer crystal scanning
Diffraction‐enhanced imaging (DEI) has high sensitivity and a wide dynamic range of density and thus can be used for fine imaging of biological and organic samples that include large differences in density. A fast DEI method composed of continuous fast sample rotations and slow analyzer crystal scan...
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Published in: | Journal of synchrotron radiation 2020-03, Vol.27 (2), p.468-471 |
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Main Authors: | , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Request full text |
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Summary: | Diffraction‐enhanced imaging (DEI) has high sensitivity and a wide dynamic range of density and thus can be used for fine imaging of biological and organic samples that include large differences in density. A fast DEI method composed of continuous fast sample rotations and slow analyzer crystal scanning was developed to shorten the measurement period. Fine sectional images of a biological sample were successfully obtained within a half measurement period of the conventional step‐scanning method while keeping the same exposure time. In addition, a fine three‐dimensional image of a rat tail was obtained with a 375 s measurement period.
Fast diffraction‐enhanced imaging composed of continuous fast rotations of samples and slow scanning of analyzer crystals has been developed. |
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ISSN: | 1600-5775 0909-0495 1600-5775 |
DOI: | 10.1107/S1600577519016795 |