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Fast diffraction‐enhanced imaging using continuous sample rotation and analyzer crystal scanning

Diffraction‐enhanced imaging (DEI) has high sensitivity and a wide dynamic range of density and thus can be used for fine imaging of biological and organic samples that include large differences in density. A fast DEI method composed of continuous fast sample rotations and slow analyzer crystal scan...

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Bibliographic Details
Published in:Journal of synchrotron radiation 2020-03, Vol.27 (2), p.468-471
Main Authors: Yoneyama, Akio, Lwin, Thet Thet, Kawamoto, Masahide
Format: Article
Language:English
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Summary:Diffraction‐enhanced imaging (DEI) has high sensitivity and a wide dynamic range of density and thus can be used for fine imaging of biological and organic samples that include large differences in density. A fast DEI method composed of continuous fast sample rotations and slow analyzer crystal scanning was developed to shorten the measurement period. Fine sectional images of a biological sample were successfully obtained within a half measurement period of the conventional step‐scanning method while keeping the same exposure time. In addition, a fine three‐dimensional image of a rat tail was obtained with a 375 s measurement period. Fast diffraction‐enhanced imaging composed of continuous fast rotations of samples and slow scanning of analyzer crystals has been developed.
ISSN:1600-5775
0909-0495
1600-5775
DOI:10.1107/S1600577519016795