X‐ray optics and beam characterization using random modulation: experiments

A parallel paper [Berujon, Cojocaru, Piault, Celestre, Roth, Barrett & Ziegler (2020), J. Synchrotron Rad.27, 284–292] reviewed theoretically some of the available processing schemes for X‐ray wavefront sensing based on random modulation. Shown here are experimental applications of the technique...

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Bibliographic Details
Published in:Journal of synchrotron radiation 2020-03, Vol.27 (2), p.293-304
Main Authors: Berujon, Sebastien, Cojocaru, Ruxandra, Piault, Pierre, Celestre, Rafael, Roth, Thomas, Barrett, Raymond, Ziegler, Eric
Format: Article
Language:English
Subjects:
at‐wavelength metrology
Beams (radiation)
metrology
Modulation
near‐field speckle‐based phase‐sensing
Optical components
optics
Optimization
Production methods
speckle
Wave fronts
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Summary:A parallel paper [Berujon, Cojocaru, Piault, Celestre, Roth, Barrett & Ziegler (2020), J. Synchrotron Rad.27, 284–292] reviewed theoretically some of the available processing schemes for X‐ray wavefront sensing based on random modulation. Shown here are experimental applications of the technique for characterizing both refractive and reflective optical components. These fast and accurate X‐ray at‐wavelength metrology methods can assist the manufacture of X‐ray optics that transport X‐ray beams with a minimum amount of wavefront distortion. It is also recalled how such methods can facilitate online optimization of active optics. The X‐ray near‐field speckle‐based phase‐sensing approach and its associated processing schemes are illustrated experimentally in the context of optics and beam characterization.
ISSN:1600-5775
0909-0495
1600-5775
DOI:10.1107/S1600577520000508