X‐ray optics and beam characterization using random modulation: theory

X‐ray near‐field speckle‐based phase‐sensing approaches provide efficient means of characterizing optical elements. Presented here is a theoretical review of several of these speckle methods within the framework of optical characterization, and a generalization of the concept is provided. As is also...

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Bibliographic Details
Published in:Journal of synchrotron radiation 2020-03, Vol.27 (2), p.284-292
Main Authors: Berujon, Sebastien, Cojocaru, Ruxandra, Piault, Pierre, Celestre, Rafael, Roth, Thomas, Barrett, Raymond, Ziegler, Eric
Format: Article
Language:English
Subjects:
at‐wavelength metrology
Beams (radiation)
Metrology
near‐field speckle‐based phase‐sensing
Optical components
Optical properties
Optics
speckle
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Summary:X‐ray near‐field speckle‐based phase‐sensing approaches provide efficient means of characterizing optical elements. Presented here is a theoretical review of several of these speckle methods within the framework of optical characterization, and a generalization of the concept is provided. As is also demonstrated experimentally in a parallel paper [Berujon, Cojocaru, Piault, Celestre, Roth, Barrett & Ziegler (2020), J. Synchrotron Rad.27, (this issue)], the methods theoretically developed here can be applied to different beams and optics and within a variety of situations where at‐wavelength metrology is desired. By understanding the differences between the various processing methods, it is possible to find and implement the most suitable approach for each metrology scenario. A theoretical review is provided of the X‐ray near‐field speckle‐based phase‐sensing approach and its associate processing schemes available for optics and beam characterization.
ISSN:1600-5775
0909-0495
1600-5775
DOI:10.1107/S1600577520000491