Mean free path and density of conductance electrons in platinum determined by the size effect in extremely thin films

A new method was developed to determine the mean free path, I infinity , and the conductivity, sigma infinity , of charge carriers in metals by investigating the thickness dependence of the conductivity of thin films. The method includes also surface effects as given by the specularity parameters p...

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Bibliographic Details
Published in:Physical review. B, Condensed matter Condensed matter, 1980-12, Vol.22 (12), p.6065-6073
Main Authors: Fischer, Gerd, Hoffmann, Horst, Vancea, Johann
Format: Article
Language:English
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Summary:A new method was developed to determine the mean free path, I infinity , and the conductivity, sigma infinity , of charge carriers in metals by investigating the thickness dependence of the conductivity of thin films. The method includes also surface effects as given by the specularity parameters p and the surface roughness amplitude h. Experimental data taken during film growth could be fitted to theoretical size-effect relations only if nonzero specularity and heterogeneous film cross-section caused by the surface roughness is introduced. The method allows determination of the Fermi-surface area and the electron density of the isotropic (amorphous) films. Both are smaller than expected from published bulk material data.27 refs.--AA
ISSN:0163-1829
DOI:10.1103/PhysRevB.22.6065