Sodium-hydrogen interdiffusion in sodium silicate glasses

The hydration of Na 2O · 3 SiO 2 glasses is studied using the sputter-induced photon spectrometry technique (SIPS) to measure the depth-profiles of hydrogen and sodium. The results clearly show a penetration of hydrogen and a leaching of sodium in the glass. The thicknesses of the hydrated layers ar...

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Bibliographic Details
Published in:Journal of non-crystalline solids 1980, Vol.41 (1), p.89-98
Main Authors: Houser, C.A., Herman, J.S., Tsong, I.S.T., White, W.B., Lanford, W.A.
Format: Article
Language:English
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Summary:The hydration of Na 2O · 3 SiO 2 glasses is studied using the sputter-induced photon spectrometry technique (SIPS) to measure the depth-profiles of hydrogen and sodium. The results clearly show a penetration of hydrogen and a leaching of sodium in the glass. The thicknesses of the hydrated layers are determined as functions of time and temperature. The thicknes dependence on the square root of time indicates that a diffusion process is in operation. The data are fitted to he Doremus model of interdiffusing ions and the diffusion coefficients for hydrogen and sodium are calculated.
ISSN:0022-3093
1873-4812
DOI:10.1016/0022-3093(80)90194-5