Sodium-hydrogen interdiffusion in sodium silicate glasses

The hydration of Na 2O · 3 SiO 2 glasses is studied using the sputter-induced photon spectrometry technique (SIPS) to measure the depth-profiles of hydrogen and sodium. The results clearly show a penetration of hydrogen and a leaching of sodium in the glass. The thicknesses of the hydrated layers ar...

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Published in:Journal of non-crystalline solids 1980, Vol.41 (1), p.89-98
Main Authors: Houser, C.A., Herman, J.S., Tsong, I.S.T., White, W.B., Lanford, W.A.
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Language:English
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cited_by cdi_FETCH-LOGICAL-c250t-8967cc7038e827850d71fa154ef57dd2e1d47483038ef0a465a138668b967b8f3
cites cdi_FETCH-LOGICAL-c250t-8967cc7038e827850d71fa154ef57dd2e1d47483038ef0a465a138668b967b8f3
container_end_page 98
container_issue 1
container_start_page 89
container_title Journal of non-crystalline solids
container_volume 41
creator Houser, C.A.
Herman, J.S.
Tsong, I.S.T.
White, W.B.
Lanford, W.A.
description The hydration of Na 2O · 3 SiO 2 glasses is studied using the sputter-induced photon spectrometry technique (SIPS) to measure the depth-profiles of hydrogen and sodium. The results clearly show a penetration of hydrogen and a leaching of sodium in the glass. The thicknesses of the hydrated layers are determined as functions of time and temperature. The thicknes dependence on the square root of time indicates that a diffusion process is in operation. The data are fitted to he Doremus model of interdiffusing ions and the diffusion coefficients for hydrogen and sodium are calculated.
doi_str_mv 10.1016/0022-3093(80)90194-5
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_23866954</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>0022309380901945</els_id><sourcerecordid>23866954</sourcerecordid><originalsourceid>FETCH-LOGICAL-c250t-8967cc7038e827850d71fa154ef57dd2e1d47483038ef0a465a138668b967b8f3</originalsourceid><addsrcrecordid>eNp9kE1LxDAQhoMoWFf_gYeeRA_VpEma9CLI4hcseFDPIZtM1ki3XTOtsP_edlc8Opdh4HlfmIeQc0avGWXVDaVlWXBa80tNr2rKalHIA5IxrXghNCsPSfaHHJMTxE86juI6I_Vr5-OwLj62PnUraPPY9pB8DGHA2E1njjsix9hEZ3vIV41FBDwlR8E2CGe_e0beH-7f5k_F4uXxeX63KFwpaV_oulLOKco16FJpSb1iwTIpIEjlfQnMCyU0n4BAraikZVxXlV6OwaUOfEYu9r2b1H0NgL1ZR3TQNLaFbkBTTnQtxQiKPehSh5ggmE2Ka5u2hlEzeTKTBDNJMJqanScjx9jtPgbjE98RkkEXoXXgYwLXG9_F_wt-AL1AbiI</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>23866954</pqid></control><display><type>article</type><title>Sodium-hydrogen interdiffusion in sodium silicate glasses</title><source>ScienceDirect - Materials Science backfile journals</source><creator>Houser, C.A. ; Herman, J.S. ; Tsong, I.S.T. ; White, W.B. ; Lanford, W.A.</creator><creatorcontrib>Houser, C.A. ; Herman, J.S. ; Tsong, I.S.T. ; White, W.B. ; Lanford, W.A.</creatorcontrib><description>The hydration of Na 2O · 3 SiO 2 glasses is studied using the sputter-induced photon spectrometry technique (SIPS) to measure the depth-profiles of hydrogen and sodium. The results clearly show a penetration of hydrogen and a leaching of sodium in the glass. The thicknesses of the hydrated layers are determined as functions of time and temperature. The thicknes dependence on the square root of time indicates that a diffusion process is in operation. The data are fitted to he Doremus model of interdiffusing ions and the diffusion coefficients for hydrogen and sodium are calculated.</description><identifier>ISSN: 0022-3093</identifier><identifier>EISSN: 1873-4812</identifier><identifier>DOI: 10.1016/0022-3093(80)90194-5</identifier><language>eng</language><publisher>Elsevier B.V</publisher><ispartof>Journal of non-crystalline solids, 1980, Vol.41 (1), p.89-98</ispartof><rights>1980</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c250t-8967cc7038e827850d71fa154ef57dd2e1d47483038ef0a465a138668b967b8f3</citedby><cites>FETCH-LOGICAL-c250t-8967cc7038e827850d71fa154ef57dd2e1d47483038ef0a465a138668b967b8f3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.sciencedirect.com/science/article/pii/0022309380901945$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,780,784,3555,4024,27923,27924,27925,46004</link.rule.ids></links><search><creatorcontrib>Houser, C.A.</creatorcontrib><creatorcontrib>Herman, J.S.</creatorcontrib><creatorcontrib>Tsong, I.S.T.</creatorcontrib><creatorcontrib>White, W.B.</creatorcontrib><creatorcontrib>Lanford, W.A.</creatorcontrib><title>Sodium-hydrogen interdiffusion in sodium silicate glasses</title><title>Journal of non-crystalline solids</title><description>The hydration of Na 2O · 3 SiO 2 glasses is studied using the sputter-induced photon spectrometry technique (SIPS) to measure the depth-profiles of hydrogen and sodium. The results clearly show a penetration of hydrogen and a leaching of sodium in the glass. The thicknesses of the hydrated layers are determined as functions of time and temperature. The thicknes dependence on the square root of time indicates that a diffusion process is in operation. The data are fitted to he Doremus model of interdiffusing ions and the diffusion coefficients for hydrogen and sodium are calculated.</description><issn>0022-3093</issn><issn>1873-4812</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1980</creationdate><recordtype>article</recordtype><recordid>eNp9kE1LxDAQhoMoWFf_gYeeRA_VpEma9CLI4hcseFDPIZtM1ki3XTOtsP_edlc8Opdh4HlfmIeQc0avGWXVDaVlWXBa80tNr2rKalHIA5IxrXghNCsPSfaHHJMTxE86juI6I_Vr5-OwLj62PnUraPPY9pB8DGHA2E1njjsix9hEZ3vIV41FBDwlR8E2CGe_e0beH-7f5k_F4uXxeX63KFwpaV_oulLOKco16FJpSb1iwTIpIEjlfQnMCyU0n4BAraikZVxXlV6OwaUOfEYu9r2b1H0NgL1ZR3TQNLaFbkBTTnQtxQiKPehSh5ggmE2Ka5u2hlEzeTKTBDNJMJqanScjx9jtPgbjE98RkkEXoXXgYwLXG9_F_wt-AL1AbiI</recordid><startdate>1980</startdate><enddate>1980</enddate><creator>Houser, C.A.</creator><creator>Herman, J.S.</creator><creator>Tsong, I.S.T.</creator><creator>White, W.B.</creator><creator>Lanford, W.A.</creator><general>Elsevier B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7QQ</scope><scope>7U5</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>1980</creationdate><title>Sodium-hydrogen interdiffusion in sodium silicate glasses</title><author>Houser, C.A. ; Herman, J.S. ; Tsong, I.S.T. ; White, W.B. ; Lanford, W.A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c250t-8967cc7038e827850d71fa154ef57dd2e1d47483038ef0a465a138668b967b8f3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1980</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Houser, C.A.</creatorcontrib><creatorcontrib>Herman, J.S.</creatorcontrib><creatorcontrib>Tsong, I.S.T.</creatorcontrib><creatorcontrib>White, W.B.</creatorcontrib><creatorcontrib>Lanford, W.A.</creatorcontrib><collection>CrossRef</collection><collection>Ceramic Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of non-crystalline solids</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Houser, C.A.</au><au>Herman, J.S.</au><au>Tsong, I.S.T.</au><au>White, W.B.</au><au>Lanford, W.A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Sodium-hydrogen interdiffusion in sodium silicate glasses</atitle><jtitle>Journal of non-crystalline solids</jtitle><date>1980</date><risdate>1980</risdate><volume>41</volume><issue>1</issue><spage>89</spage><epage>98</epage><pages>89-98</pages><issn>0022-3093</issn><eissn>1873-4812</eissn><abstract>The hydration of Na 2O · 3 SiO 2 glasses is studied using the sputter-induced photon spectrometry technique (SIPS) to measure the depth-profiles of hydrogen and sodium. The results clearly show a penetration of hydrogen and a leaching of sodium in the glass. The thicknesses of the hydrated layers are determined as functions of time and temperature. The thicknes dependence on the square root of time indicates that a diffusion process is in operation. The data are fitted to he Doremus model of interdiffusing ions and the diffusion coefficients for hydrogen and sodium are calculated.</abstract><pub>Elsevier B.V</pub><doi>10.1016/0022-3093(80)90194-5</doi><tpages>10</tpages></addata></record>
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title Sodium-hydrogen interdiffusion in sodium silicate glasses
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-25T14%3A54%3A04IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Sodium-hydrogen%20interdiffusion%20in%20sodium%20silicate%20glasses&rft.jtitle=Journal%20of%20non-crystalline%20solids&rft.au=Houser,%20C.A.&rft.date=1980&rft.volume=41&rft.issue=1&rft.spage=89&rft.epage=98&rft.pages=89-98&rft.issn=0022-3093&rft.eissn=1873-4812&rft_id=info:doi/10.1016/0022-3093(80)90194-5&rft_dat=%3Cproquest_cross%3E23866954%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c250t-8967cc7038e827850d71fa154ef57dd2e1d47483038ef0a465a138668b967b8f3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=23866954&rft_id=info:pmid/&rfr_iscdi=true