Synchrotron-radiation measurements of forbidden reflections in silicon and germanium

The (442) and (622) reflections in both Si and Ge were measured using synchrotron radiation from the Wilson 12-GeV Synchrotron. These reflections, which are basis forbidden in diamond-structure materials, arise from two distinct effects: antisymmetric charge buildup due to covalent bonding of the va...

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Bibliographic Details
Published in:Physical review. B, Condensed matter Condensed matter, 1980-01, Vol.22 (6), p.2887-2897
Main Authors: Mills, D., Batterman, B. W.
Format: Article
Language:English
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Summary:The (442) and (622) reflections in both Si and Ge were measured using synchrotron radiation from the Wilson 12-GeV Synchrotron. These reflections, which are basis forbidden in diamond-structure materials, arise from two distinct effects: antisymmetric charge buildup due to covalent bonding of the valence electrons and anharmonic thermal vibrations of the core electrons. Because these reflections are sensitive only to deviations from a centrosymmetric charge density, their integrated intensities are extremely small. The anharmonic contribution can be removed from the values leaving the scattering amplitude due solely to the bond change. New techniques utilizing the inherent properties of synchrotron radiation are discussed.29 refs.--AA
ISSN:0163-1829
DOI:10.1103/PhysRevB.22.2887