Transmission Electron Microscopy at Grain Boundaries of PTC-Type BaTiO3 Ceramics

Transmission electron microscopy of the grain boundaries of Ti‐rich semiconducting PTC‐type BaTiO3 ceramics is described. At a width of 2 to 10 nm, there were no indications of intergranular second‐phase layers covering the grains. Second phase was segregated only at the contacts of three or more gr...

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Bibliographic Details
Published in:Journal of the American Ceramic Society 1980-01, Vol.63 (5-6), p.288-291
Main Authors: HAANSTRA, H. B., IHRIG, H.
Format: Article
Language:English
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Summary:Transmission electron microscopy of the grain boundaries of Ti‐rich semiconducting PTC‐type BaTiO3 ceramics is described. At a width of 2 to 10 nm, there were no indications of intergranular second‐phase layers covering the grains. Second phase was segregated only at the contacts of three or more grains; electron diffraction confirmed the amorphous structure of this phase. Observed ferroelectric domains at the grain boundaries do not indicate a PTC‐specific orientation of ferroelectric domains due to the negative grain surface charge.
ISSN:0002-7820
1551-2916
DOI:10.1111/j.1151-2916.1980.tb10722.x