Absolute Measurement of the (220) Lattice Plane Spacing in a Silicon Crystal

The (220) lattice plane spacing of an almost perfect crystal of Si was measured by means of a combined scanning (LLL) X-ray interferometer and a two-beam optical interferometer. From 170 measurements, a value d220 = (192 015.560 plus/minus 0.012) fm results in vacuum at 22.50 deg C. This value is sm...

Full description

Saved in:
Bibliographic Details
Published in:Physical review letters 1981-06, Vol.46 (23), p.1540-1543
Main Authors: Becker, Peter, Dorenwendt, Klaus, Ebeling, Gerhard, Lauer, Rolf, Lucas, Wolfgang, Probst, Reinhard, Rademacher, Hans-Joachim, Reim, Gerhard, Seyfried, Peter, Siegert, Helmut
Format: Article
Language:English
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The (220) lattice plane spacing of an almost perfect crystal of Si was measured by means of a combined scanning (LLL) X-ray interferometer and a two-beam optical interferometer. From 170 measurements, a value d220 = (192 015.560 plus/minus 0.012) fm results in vacuum at 22.50 deg C. This value is smaller by 1.8 x 10 -- 6d220 than that reported by Deslattes, et al. for another crystal. Generic variabilities of the two crystals account only for a part of this difference.19 refs.--AA
ISSN:0031-9007
DOI:10.1103/PhysRevLett.46.1540