Extended x-ray-absorption fine structure: direct comparison of absorption and electron yield

• Published in: Physical review. B, Condensed matter Condensed matter, 1985-05, Vol.31 (10), p.6233-6237
• Main Authors: GUO, T, DENBOER, M. L
• Format: Article
• Language: English
• Subjects: Condensed matter: electronic structure, electrical, magnetic, and optical properties; Cross-disciplinary physics: materials science; rheology; Exact sciences and technology; Materials science; Metals, semimetals and alloys; Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation; Other interactions of matter with particles and radiation; Physics; Specific materials
• ISSN: 0163-1829; 1095-3795
• DOI: 10.1103/physrevb.31.6233

Using a simple ionization detector to monitor the total electron yield, extended X-ray-absorption fine structure above the Ni, Fe, and Cr K edges in the X-ray region was measured. This technique is somewhat surface sensitive; a sampling depth of approx 1000 A was measured. The fact that these materials do not differ from the bulk over this depth allows direct comparison with conventional absorption measurements. Interatomic spacings determined from the yield agree well with those measured by absorption. However, amplitudes differ significantly. These results have implications for the extraction of coordination numbers from the surface-sensitive variants of extended fine structures which monitor the electron yield. Finally, the electron-yield detector used here, employing conventional X-ray monochromators and not requiring elaborate precautions to prepare pristine surfaces, should prove useful in the study of, e.g., plated specimens or catalysts. 19 ref.--AA